집중유도형 교류전위차법의 알루미늄 탐촉자에 의한 상자성체 이면결함의 평가 Evaluation of Blind Defects in Paramagnetic Materials by Aluminum Probe of ICFPD Method
pp.436-442
Defects in most structures can be generated not only on outside but also on inside or on the back-side during the manufacturing or construction process. Also they cause the growth of defects due to operation of various complex environments and structures will be destroyed eventually. In order to improve the reliability of the structure, the detection and size-estimation of defects should be investigated. In this paper, as an extension of previous studies on surface defects, two-dimensional artificial backside cracks (blind cracks) into paramagnetic material were evaluated by using the same aluminum probe. The potential drop at the defect position is distributed in the n-shape in the case of the back defect, which is different from results of the surface defect (u-shape). The potential drops at the defect position are measured with the largest value. The potential drop ratio (Vcmax/Vs) for the defective position is used as a parameter to predict the thickness (l) of defect position.
1. 서 론
2. 실험 방법
2.1 시험편
3. 실험결과 및 고찰
3.1 측정전위차 분포
3.2 이면결함의 결함부 두께 (l)평가
4. 결 론
References