We used Brewster’sLaw to examine the mechanism of liquid crystal(LC) alignment on anorganic insulation layer when subjected to ion-beam irradiation. Brewster’s Law implies that the maximum rate polarized ray on a slanted insulation layers on the substrate and it illustrates the dependence of polarization and the mechanical structure on the ionbeam irradiation process. The pretilt angle of nematic LCs on the organic insulation surface was about 1.13° for an ionbeam exposure of 45° for 1minute at 1800eV. This shows the dependence of LC alignment on the polarization ratio in a slanted organic insulation layer.

Using UV nanoimprint lithography(UV-NIL), 1-dimensional(1-D) pattern structures were fabricated on a hybrid mixture thin film of lanthanum oxide and a UV-curable resin. 1-D pattern on a wafer fabricated by the laser interference lithography was transferred to polydimethylsiloxane and this is used as a mold of UV-NIL process. Conducting an X-ray photoelectron spectroscopy, C 1s and La 3d spectra were analyzed, and it was confirmed that hybrid thin film was successfully deposited on glass substrate. Also, transferred pattern structure was observed by using an atomic force microscopy. Through this, it was revealed that agglomerations between 1-D pattern were increased as UV irradiation time increased and this phenomenon disrupted the quality of NIL process. Additionally, liquid crystal(LC) cells with patterned hybrid thin films were fabricated and LC alignment performances were investigated. Using the polarizing optical microscopy and the crystal rotation method, LC alignment state and pretilt angles were observed. Consequently, the uniform homogeneous LC alignment was achieved at UV irradiation time of 1min and 3min where high resolution pattern transfer was observed.

Using lanthanum zinc oxide (LZO) film with the ion-beam irradiation, uniform and homogeneous liquid crystal (LC) alignment was achieved. To fabricate the LZO thin film on glass substrate, solution process was conducted as a deposition method. Cross-polarized optical microscopy (POM) and the crystal rotation method reveal the state of LC alignment on the ion-beam irradiated LZO film. Between orthogonally placed polarizers, POM image showed constant black color with regular transmittance. Furthermore, collected incidence angle versus transmittance curve from the crystal rotation method revealed that the LC molecules on the ion-beam irradiated LZO film were aligned homogeneously. Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) were conducted to reveal the relationship between the ion-beam irradiation and the LC alignment. The ion-beam irradiation changed the LZO film surface to rougher than before by etching effect. Numerical roughness values from AFM analysis supported this phenomenon specifically. XPS analysis showed the chemical composition change due to the ion-beam irradiation by investigation of O 1s, La 3d and Zn 2p spectra. The ion-beam irradiation induced the breakage of chemical bonds in the LZO film surface and this occurred surface chemical anisotropic characteristics for uniform LC alignment.

The ion-beam irradiated lanthanum zinc oxide (LZO) films were conducted as liquid crystal (LC) alignment layer to achieve uniform and homogeneous alignment of LC molecules. Polarized optical microscopy and the pre-tilt angle measurements revealed the alignment characteristics of LC molecules on the LZO film surface. Physical characteristics of the LZO film surface were analyzed by field emission scanning electron microscope and atomic force microscopy. The strong ion-beam irradiation on the LZO film changed surface rougher than before and induced physical anisotropic characteristics. Chemical composition of the LZO film was investigated by X-ray photoelectron spectroscopy and it was revealed that the ion-beam irradiation induced the breakage of the metal-oxide bonds. Due to this, anisotropic dipole moment which related with van der Waals force between LC molecules and alignment layer was induced. Because of this, LC molecules were anchored to the LZO film surface to achieve uniform LC alignment. Collecting the capacitance-voltage curve, residual DC of the LC cell with the LZO films was measured and it was verified that the LC cell with the LZO film had a nearly zero residual DC. Therefore, the ion-beam irradiated LZO film is an efficient method as an LC alignment layer

In this study, the ion beam irradiation method on organic (polyamic acid and epoxy resin compound) overcoat layer was investigated. The use of ion beam on overcoat organic layer has the potential to replace conventional rubbing process. The traditional alignment layer is made by coating process and 2 times heat treatment on polyamic acid liquid. It requires many times and process steps. However, it is very economic and convenient process substitute polyimide alignment layer for organic overcoat. In order to characterize the LC alignment the polarized microscope image and pretilt angle measurement were investigated. The good LC aligning capabilities treated on the organic overcoat thin film surfaces with ion beam exposure of 45° at above ion beam energy density of 1200 eV were achieved.

Homogeneous liquid crystal (LC) alignment on hafnium strontium oxide (HfSrO) films prepared by sol-gel process via ion-beam (IB) bombardment was investigated. Uniform LC alignment was achieved on the IB-irradiated HfSrO films at IB intensity of 1.8 keV. We confirmed the effect of surface morphology on LC alignment using field-emission scanning electron microscope (FE-SEM). In addition, we observed electro-optical characteristics of the twisted-nematic (TN)-LC cells based on HfSrO films to verify the possibility of LC display (LCD) application.

일반적인 pattemed vertical alignment (PV A)모드는 도에인의 경계부분에서의 액정 방향자틀 의 충돌로 인해 투과율 감소를 나타나게 된다. 이 문제를 해결하기 위해 본 논문에서는 하부기판 화소 전극 사이에 바이어스 전극을 위치시킨 새로운 형태의 PVA모드를 제안하였다. 제안된 구조에 전압 인 가시 상하부 가판에 수직전기장 뿐만 아니라 화소전극과 바이어스 전극간의 프란지 필드륜 형성하게 되어 액정 방향자들의 충돌이 작아지게 된다. 그 결과 본 논문에서 제안한 새로운 PVA의 광 투과율은 기존 PVS 모드에 비해 10%이상 향상되었다.

수평 배향 액정 모드는 양의 유전율 이방성과 음의 유전융 이방성 액정을 사용한 프린지 필드 스위칭과 양의 유전율 이방성 액정을 사용한 인플래인 스위칭 모드가 대표적이다 . 이 대표적인 세 구동 방식의 화질 특성을 비교하기 위하여 각각의 최척화된 위상지연 값 조건하에서 밝기, 명암대비율과 색 특성을 조사하였다. 그 결과 양액정과 음액정을 사용한 프린지 필드 스위칭 모드가 밝기와 명암대비율 면에 있어서 인플래인 스위칭 모드보다 우수한 특성을 보인다. 또한 양액정을 사용한 프린지 필드 스위 칭 모드는 시야각 방향에서 적은 색 변이 특성을 보인다.

Field sequential 액정 디스플레이(FSLCD)는 컬러필터를 사용하지 않아 높은 투과율 특성을 보이고 광 원으로 LED를 사용함으로써 색재현성이 매우 우수하다. 하지만 FSLCD(60Hz 구동)를 실현하기 위해서는 액정의 응답속도가 5ms이하로 고속응답 특성을 보여야 한다. 따라서 본 논문에서는 고속응답 ECB(electrically controlled birefringence) 셀의 최적 구조를 연구하여 5ms 이하의 응답시간을 얻었다. 그리고 ECB 모드에서 높은 구동전압과 시야각을 개선하기 위해 필름 보상을 연구하였다. 판상형 액정필름(discotic film)과 TAC(triacetyl cellulose) 필름의 위상차 값을 최적화함으로써 구동전압을 5V로 낮추고 상하좌우에서 160° 이상(CR>10:1)의 시야각을 실현하였다.

강유전성 액정 분자 배향을 위해 열방성 고분자 액정물질을 배향막으로 사용하고 그표면 morphology를 AFM(Atomic Forced Microscope)으로 관찰한 결과 잘 배향된 sample cell에서도 microgroove 구조가 나타나지 않았음을 관찰하였다. 잘 배향된 sample cell 23:1의 contrast ratio를 보이면서 memory 효과를 나타내었다. 또한 20V의 AC field로 안정화시키자 전형적인 stripe-shaped 무늬가 나타났다.

The polyimide film surface was modified with KOH aqueous solutions or sulfuric acid. The film thickness was increased by about 10% through the modification of film surface. Hydrolysis of amide bonds and hydration of water induced the increase. The polarity of the film surface increased and identified by contact angle measurement. The depth and roughness of modified was increased. After treatment of surface with water, alkyl and 4-pentyloxyaniline were introduced on the film surface by complex formation between anionic species formed on the imide surface and ammonium ion. The newly introduced alkyl group was identified by FT-IR spectroscopy. Surface polarity reduced dramatically and the roughness was increased after introduction of ammonium salt.