The paper presents the analysis of Accelerated Reliability Growth (ARG) process data during design and development on non repairable systems. A projection model has been developed which will compress testing time and also accelerate failure mechanisms in which all corrective actions are delayed until at the end of the test. In addition, time to failure in stress test do not have to be converted to time to failure in normal condition. By applying this model, it targets to save cost through speedier testing time and reducing number of prototypes needed. As a result, the total life cycle cost of product will be reduced.

Abstract
 1. INTRODUCTION
 2. THE MODEL - APPLICATIONAMSAA MODEL COUPLED WITHARRHENIUS MODEL
 3. NUMERICAL EXAMPLE
 4. CONCLUSION
 REFERENCE

• Azianti Ismail(Daegu University)
• Pham Ngoc Hung(Daegu University)
• Won Jung(Daegu University)