논문 상세보기
This paper presents an automated determination technique of optimal subset sizes for digital image correlation (DIC) analysis of speckle patterned images. The smaller subset size would typically have the higher DIC accuracy with respect to local minute deformation, but insufficient speckle pattern information within the excessively small often augment DIC errors due to lack of correlation features. Therefore, optimal subset size determination is crucial for the precise DIC analysis. To automate the optimal subset size determination process, first, the reference and test speckle pattern images are obtained from the target structure surface with a certain time interval. Then, an initial seed point which will be used for the subset center point is assigned on the reference speckle pattern image. Subsequently, normalized cross correlation (NCC) between the reference and test images is performed by increasing subset sizes from the seed point. Next, the matching distance between the two images is calculated using the maximum correlation coefficient. As the subset size increases, the matching distance between the two subsets converges a certain value. It physically means that the sufficient correlation features will be included in the subset. Finally, the optimal subset size can be determined by selecting the minimum subset size where the matching distance value starts to be converged. The proposed technique is experimentally validated using an aluminium plate with sprayed speckle pattern.
1. 서 론
2. NCC 기반의 자동화 서브셋 크기 산출 실험
3. 실험적 검증 결과
4. 결 론
참고문헌
