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반도체 AMC 모니터링용 샘플링 테스트 모듈에 관한 연구 KCI 등재

A Study on Sampling Test Module for Semiconductor AMC Monitoring

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  • URLhttps://db.koreascholar.com/Article/Detail/427134
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한국기계기술학회지 (Journal of the Korean Society of Mechanical Technology)
한국기계기술학회 (Korean Society of Mechanical Technology)
초록

The sampling test module of the existing AMC Monitoring System is constructed using tubes and fittings, so there has been a problem with molecular contaminants remaining in the system. This study demonstrated how a new manifold-type sampling test module without connecting tubes and fittings, and with super-hydrophobic coating improves residual molecular contaminants in the AMC Monitoring System through CDA purge when molecular contamination occurs in a clean room with a Semiconductor Fabrication.

저자
  • 권혁상(한성대학교) | Hyuk-Sang Kwon (Ph.D student, Department of Smart Convergence Consulting, Hansung University) Corresponding author