Chemical environments of near-field (Engineered barrier and surrounded host rock) can influence performance of a deep geological repository. The chemical environments of near-field change as time evolves eventually reaching a steady state. During the construction of a deep geological repository, O2 will be introduced to the deep geological repository. The O2 can cause corrosion of Cu canisters, and it is important predicting remaining O2 concentration in the near-field. The remaining O2 concentration in the near field can be governed by the following two reactions: oxidation of Cu(I) from oxidation of Cu and oxidation of pyrite in bentonite and backfill materials. These oxidation reactions (Cu(I) and pyrite oxidation) can influence the performance of the deep geological repository in two ways; the first way is consuming oxidizing agents (O2) and the second way is the changing pH in the near-field and ultimately influencing on the mass transport rate of radionuclides from spent nuclear fuel (failure of canisters) to out of the engineered barrier. Hence, it is very important to know the evolution of chemical environments of near-field by the oxidation of pyrite and Cu. However, the oxidation kinetics of pyrite and Cu are different in the order of 1E7 which means the overall kinetics cannot be fully considered in the deep geological repository. Therefore, it is important to develop a simplified Cu and pyrite oxidation kinetics model based on deep geological repository conditions. Herein, eight oxidation reactions for the chemical species Cu(I) were considered to extract a simplified kinetic equation. Also, a simplified kinetics equation was used for pyrite oxidation. For future analysis, simplified chemical reactions should be combined with a Multiphysics Cu corrosion model to predict the overall lifetime of Cu canisters.

• Nakkyu Chae(Seoul National University (SNU))
• Samuel Park(Seoul National University (SNU))
• Seungjin Seo(Seoul National University (SNU))
• Richard I. Foster(Seoul National University (SNU))
• Shuang Liu(Seoul National University (SNU))
• Sungyeol Choi(Seoul National University (SNU)) Corresponding author