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반도체 세정 공정에서 IPA 필터 관리 미비가 초래하는 금속 이온 오염과 소자 전기 특성 저하 메커니즘

Mechanism of Metal‑Ion Contamination and Electrical‑Performance Degradation Caused by Inadequate IPA Filter Management in Semiconductor Cleaning Processes

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  • URLhttps://db.koreascholar.com/Article/Detail/445363
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한국막학회 (The Membrane Society Of Korea)
저자
  • 김정현(Defect & Environment Control, SK 하이닉스) | Jeonghyeon Kim (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea) Corresponding author
  • 함성보(Defect & Environment Control, SK 하이닉스) | Sungbo Ham (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 김정모(Defect & Environment Control, SK 하이닉스) | Jeongmo Kim (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 박병준(Defect & Environment Control, SK 하이닉스) | Byungjun Park (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 최은미(Defect & Environment Control, SK 하이닉스) | Eunmi Choi (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 김민중(Defect & Environment Control, SK 하이닉스) | Minjoong Kim (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 김준한(Defect & Environment Control, SK 하이닉스) | Junhan Kim (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)
  • 김기봉(Defect & Environment Control, SK 하이닉스) | Kibong Kim (Defect & Environment Control, SK Hynix, Icheon, Gyeonggi-do, Republic of Korea)