In this study, surface roughness and interfacial defect characteristics were analyzed after forming a high-k oxide film on the surface of a prime wafer and a test wafer, to study the possibility of improving the quality of the test wafer. As a result of checking the roughness, the deviation in the test after raising the oxide film was 0.1 nm, which was twice as large as that of the Prime. As a result of current-voltage analysis, Prime after PMA was 1.07 × 10 A/cm2 and Test was 5.61 × 10 A/cm2, which was about 5 times lower than Prime. As a result of analyzing the defects inside the oxide film using the capacitancevoltage characteristic, before PMA Prime showed a higher electrical defect of 0.85 × 1012 cm2 in slow state density and 0.41 × 1013 cm2 in fixed oxide charge. However, after PMA, it was confirmed that Prime had a lower defect of 4.79 × 1011 cm2 in slow state density and 1.33 × 1012 cm2 in fixed oxide charge. The above results confirm the difference in surface roughness and defects between the Test and Prime wafer.

In this study, the surface passivation process for InP-based quantum dots (QDs) is investigated. Surface coating is performed with poly(methylmethacrylate) (PMMA) and thioglycolic acid. The quantum yield (QY) of a PMMA-coated sample slightly increases by approximately 1.3% relative to that of the as-synthesized InP/ZnS QDs. The QYs of the uncoated and PMMA-coated samples drastically decrease after 16 days because of the high defect state density of the InP-based QDs. PMMA does not have a significant effect on the defect passivation. Thioglycolic acid is investigated in this study for the effective surface passivation of InP-based QDs. Surface passivation with thioglycolic acid is more effective than that with the PMMA coating, and the QY increases from 1.7% to 11.3%. ZnS formed on the surface of the InP QDs and S in thioglycolic acid show strong bonding property. Additionally, the QY is further increased up to 21.0% by the photochemical reaction. Electron–hole pairs are formed by light irradiation and lead to strong bonding between the inorganic and thioglycolic acid sulfur. The surface of the InP core QDs, which does not emit light, is passivated by the irradiated light and emits green light after the photochemical reaction.

This study is a study on the cracking of the main piston surface which is generated in the injection molding machine to generate mold force. The main piston machining process consists of high frequency heat treatment, grinding and super finishing after lathe turning. Scale, defect size, and fracture texture were observed for four cracks on the surface of the piston during the tempering process after high frequency heat treatment using a metallurgical microscope. In this study, it was confirmed that the cracked structure of the piston structure was ferrite and pearlite structure. It was confirmed that cracks progressed to 480 ㎛ and scale layer of 3 ㎛ or less. Surface hardening layer and hardness were min 2.0mm/HRc 58±2 spec 1.6 mm/HRc 56.5~57.5 In addition, cracks on the surface of the piston appear perpendicular to the rolling process. Therefore, it can be assumed that the crack occurred in the low temperature tempering process at 200°C or less after the high frequency heat treatment, not the material defect. Therefore, the temperature should be maintained at 200°C or higher during tempering after high-frequency heat treatment, and the cracking defect on the surface of the piston can be prevented by setting the feed rate to 1.3 mm/s or less during heat treatment.

결함검사는 생산공정에 있어서 상품의 디자인과 함께 매우 중요한 부분으로서, 상품의 경쟁력을 높이는데 필수 불가결한 것이다. 만약, 실시간 결함검출이 상품에 대한 어떤 손상도 없이 할 수 있다면, 품질 및 공정의 효율적 관리와 고비용 인력의 절감을 통하여 생산원가를 줄일 수 있다. 본 논문에서는 철판과 같은 표면에 결함이 있는 경우 필요한 정보만을 추출할 수 있는 3가지 공간필터법에 대하여 제안하였고, 공간필터의 특성을 통하여 결함검출 시스템을 구성하였다. 그리고, 최적의 표면결함 계측용 공간필터법을 개발하기 위하여 결함의 크기와 형태, 광도의 크기 및 외부 광간섭 그리고 슬리트의 개수와 같은 파라메타의 변화에 따른 측정 성능을 비교 및 분석하였다.