Optimal Design of c Control Chart using Variable Sampling Interval
Even though the ad hoc Shewhart methods remain controversial due to various mathematical flaws, there is little disagreement among researchers and practitioners when a set of process data has a skewness distribution. In the context and language of process control, the error related to the process data shows that time to signal increases when a control parameter shifts to a skewness direction. In real-world industrial settings, however, quality practitioners often need to consider a skewness distribution. To address this situation, we developed an enhanced design method to utilize advantages of the traditional attribute control chart and to overcome its associated shortcomings. The proposed design method minimizes bias, i.e., an average time to signal for the shift of process from the target value (ATS) curve, as well as it applies a variable sampling interval (VSI) method to an attribute control chart for detecting a process shift efficiently. The results of the factorial experiment obtained by various parameter circumstances show that the VSI c control chart using nearly unbiased ATS design provides the smallest decreasing rate in ATS among other charts for all experimental cases.