논문 상세보기
Measurement of Refractive lndex and Thickness of Thin-films by Lloyd’s lnterferometer KCI 등재후보
Han Jeung Yoon, Sok Won Kim
- 언어ENG
- URLhttps://db.koreascholar.com/Article/Detail/281805
4,000원
한국화상학회지
(Journal of Korean Society for Imaging Science and Technology)
제14권 제1호 (2008.03)
pp.39-45
pp.39-45
한국화상학회
(Korean Society for Imaging Science and Technology)
키워드
Lloyd interferometerThin filmRefractive indexThicknessInterference
목차
Abstract
1. INTRODUCTION
2. THEORETICAL BACKGROUND
3. EXPERIMENT AND DISCUSSIONS
4. CONCLUSIONS
References
1. INTRODUCTION
2. THEORETICAL BACKGROUND
3. EXPERIMENT AND DISCUSSIONS
4. CONCLUSIONS
References
저자
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