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Measurement of Refractive lndex and Thickness of Thin-films by Lloyd’s lnterferometer

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  • URLhttps://db.koreascholar.com/Article/Detail/281805
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한국화상학회지 (Journal of Korean Society for Imaging Science and Technology)
한국화상학회 (Korean Society for Imaging Science and Technology)
목차
Abstract
 1. INTRODUCTION
 2. THEORETICAL BACKGROUND
 3. EXPERIMENT AND DISCUSSIONS
 4. CONCLUSIONS
 References
저자
  • Han Jeung Yoon(Haksung High School)
  • Sok Won Kim(Department of Physics, University of Ulsan)