Field emergence of Azuki bean is poor due to hard seed coat as compared to other legumes. In this study, an attempt was made to develop prediction method with regression analysis based on various seed vigor tests in laboratory for field emergence of azuki bean. Azuki bean seeds artificially aged to provide various levels of seed quality were evaluated by the standard germination test (SGT), cold germination test (CT), cool germination test (CGT), complex stressing vigor test (CSVT), tetrazolium(TZ) vigor test and electroconductivity test. The SGT was suitable for predicting the field emergence in the unaged high vigor seeds. The abnormal seedling percentage and shoot length in the CGT were highly correlated with field emergence of moderate vigor seeds artificially aged for 2 days. Electroconductivity, seed viability in the CSVT, and vigor and predicted germinability in the tetrazolium vigor test were also useful for predicting field emergence. Percent of ungerminated seed in the CSVT was correlated with field emergence in the low vigor seeds artificially aged for 4 days. In a stepwise multiple regression analysis, seed viability in the SGT, normal seedling percentage and dry matter weight in the CGT accounted for 86.9% of the predicted value of field emergence in azuki bean.