Control chart is most widely used in SPC(Statistical Process Control), Recently it is a critical issue that the standard control chart is not suitable to non-normal process with very small percent defective. Especially, this problem causes serious errors in the reliability procurement, such as semiconductor, high-precision machining and chemical process etc. Procuring process control technique for non-normal process with very small percent defective and perturbation is becoming urgent. Control chart technique in non-normal distribution become very important issue.
In this paper, we investigate on research trend of control charts under non-normal distribution.

• 김종걸(성균관대학교 시스템경영공학과) | Jong-Gurl Kim
• 김창수(성균관대학교 기술경영학과, 산업공학) | Chang-su Kim
• 엄상준(성균관대학교 산업공학) | Sang-Joon Um
• 김형만(성균관대학교 산업공학과) | Hyung-Man Kim
• 최성원(성균관대학교 산업공학과) | Seong-Won Choi
• 정동구(성균관대학교 시스템경영공학과) | Dong-Gu Jeong