Semiconductor processes are mainly divided into FAB process, package and test. The FAB process is promoting smart factories over a long period of time. The situation of the package and test process is manual, but there is a wafer testing process that prepares the latest topic "SmartFactory". The purpose of this study is to study the key variables for the completion of the material allocation scheduling system which will be the base environment of the smart factory in the wafer test process and to build the system based on the designed research model.

Abstract
 1. 서 론
 2. 이론적 고찰
  2.1 선행 연구
  2.2 스마트 팩토리
 3. 웨이퍼 검사공정의 스케줄링 모형 개발
  3.1 상황별 분석
  3.2 시스템 모형 설계
 4. 웨이퍼 검사공정의 스케줄링 구축
  4.1 스케줄링 시스템 구축
  4.2 스케줄링 시스템 도입 결과
 5. 연구결과 및 제언
 6. References

• 박민국(SK하이닉스(주)) | Min-Gook Park Corresponding Author
• 송관배(명지대학교 산업경영공학과) | Kwan-Bae Song
• 박재현(한국산업인력공단) | Jea-Hyun Park