The CRL(Conforming Run Length) control chart can perform for high yield processes and define the number of conforming items between two consecutive non-conforming ones. But the CRL control chart is not appropriate for lower yield processes because it is difficult to detect small shift in processes with the CRL control chart. This paper presents a combined CRL-CUSUM control chart and this is more efficient than CRL control chart for detecting small shift and uses the Markov Chain approach to calculate ARL(Average Run Length) values.

1. 서론 
2. CRL 관리도 
3. CRL-CUSUM 관리도의 설계 
4. CRL 관리도와 CRL-CUSUM 관리도의 비교 
5. 결론 
6. 참고문헌

• Kye Wan Kim
• Ji Yeon Park
• Deok Kyun Yun