The number of pixel defects including bright and black dots on a panel is one of the critical factors determining the quality of TFT-LCD. Since pixel defects on the TFT-LCD panels are sometimes unavoidable, manufacturers have to inspect the panels so that any panel with an unacceptable number of defects will not be delivered to the buyers. However, the buyers demand for the manufacturers to meet different pixel defects tolerances (acceptable number of pixel defects on a TFT-LCD panel) around central(tight) and peripheral(loose) inspection zones. The disagreement in quality standard among different buyers also cause confusions in screening non-confirmative products and unstable yield of production. Few research has focused on the effects of defect locations on a TFT-LCD panel on their detection probabilities and the rational division of defect inspection zones. In this research, experiments were conducted to find the detection probabilities of black dot defects with respect to their varying locations on a TFT-LCD. It is proposed a rational division of inspection zone on a TFT-LCD panel on the basis of detection probabilities of the defects. With these division of inspection zones and the mean defect detection probability within each zone, it is expected to establish a more reasonable pixel defects tolerances.

Abstract
 1. 서론
 2. 연구내용 및 방법
  2.1 실험 방법
  2.2 실험 계획
  2.3 결점 검출력 추출을 위한 실험
 3. 실험결과 및 분석
  3.1 피실험자별 결점탐지 시간과 검출력의 유의차 분석
  3.2 영역별 결점 검출력에 의한 결점 개수 비
  3.3 기존의 영역과 검출력에 의한 영역 구분
 4. 결론
 5. 참고문헌

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