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유리성형용 카본금형의 표면조도에 미치는 고출력 스퍼터링 조건의 영향 KCI 등재

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한국응용과학기술학회지 (The Korean Society of Applied Science and Technology)
한국응용과학기술학회(구 한국유화학회) (The Korean Society of Applied Science and Technology (KSAST))
초록

In this study, the various process conditions for high-power DC Magnetron Sputtering (DCMS) on the surface roughness of carbon thin films were investigated. The optimal conditions for Si/C coating were 40min for deposition time, which does not deviate from normal plasma, to obtain the maximum deposition rate, and the conditions for the best surface roughness were – 16volt bias voltage and 400watt DC power with 1.3x10-3torr chamber pressure. Under these optimal conditions, an excellent carbon thin film with a surface roughness of 1.62nm and a thickness of 724nm was obtained. As a result of XPS analysis, it was confirmed that the GLC structure ( bonding) was more dominant than the DLC structure ( bonding) in the thin film structure of the carbon composite layer formed by DC sputtering. Except in infrequent cases of relatively plasma instability, the lower bias voltage and applied power induces smaller surface roughness value due to the cooling effect and particle densification. For the optimal conditions for Graphite/C composite layer coating, a roughness of 36.3 nm and a thickness of 711 nm was obtained under the same conditions of the optimal process conditions for Si/C coating. This layer showed a immensely low roughness value compared to the roughness of bare graphite of 242 nm which verifies that carbon coating using DC sputtering is highly effective in modifying the surface of graphite molds for glass forming.

목차
1. 서 론
2. 연구방법
3. 결과 및 고찰
    3.1. 코팅 시간의 영향
    3.2. Bias voltage의 영향
    3.3. DC Power 영향
    3.4. 챔버 압력의 영향
    3.5. Graphite/C 복합층 형성
4. 결 론
References
저자
  • 주성후(대진대학교 신소재공학과, 교수) | Sung-Hoo Ju (Department of Advanced Materials Science & Engineering, Daejin University, Pocheon 11159, Korea)
  • 양재웅(대진대학교 신소재공학과, 교수) | Jae-Woong Yang (Department of Advanced Materials Science & Engineering, Daejin University, Pocheon 11159, Korea) Corresponding author