For future space IR missions, such as SPICA, it is crucial to establish an experimental method for eval- uating the performance of mid-IR detectors. In particular, the wavelength dependence of the sensitivity is important but difficult to be measured properly. We are now preparing a testing system for mid-IR Si:As/Si:Sb detectors on SPICA. We have designed a cryogenic optical system in which IR signal light from a pinhole is collimated, passed through an optical filter, and focused onto a detector. With this system, we can measure the photoresponse of the detector for various IR light using optical lters with different wavelength properties. We have fabricated aluminum mirrors which are adopted to minimize thermal distortion effects and evaluated the surface figure errors. The total wavefront error of the optical system is 1.3 μm RMS, which is small enough for the target wavelengths (20-37 μm) of SPICA. The point spread function measured at a room temperature is consistent with that predicted by the simulation. We report the optical performance of the system at cryogenic temperatures.

To realize large-format compact array detectors covering a wide far-infrared wavelength range up to 200 μm, we have been developing Blocked-Impurity-Band (BIB) type Ge detectors with the room- temperature surface-activated wafer bonding technology provided by Mitsubishi Heavy Industries. We fabricated various types of p+-i junction devices which possessed a BIB-type structure, and evaluated their spectral response curves using a Fourier transform spectrometer. From the Hall effect measurement, we also obtained the physical characteristics of the p+ layers which constituted the p+-i junction devices. The overall result of our measurement shows that the p+-i junction devices have a promising applicability as a new far-infrared detector to cover a wavelength range of 100-200 μm.