This paper describes the Bayesian approach for reliability demonstration test based on the sequential samples from the one-shot devices. The Bayesian approach involves the technical method about how to combine the prior distribution and the likelihood function to produce the posterior distribution. In this paper, the binomial distribution is adopted as a likelihood function for the one-shot devices. The relationship between the beta-binomial distribution and the Polya’s urn model is explained and is used to make a decision about whether to accept or reject the population of the one-shot devices by one by one then in terms of the faulty goods. A numerical example is also given.