The micron-sized indium zinc tin oxide (IZTO) particles were prepared by spray pyrolysis from aqueous precursor solution for indium, zinc, and tin and organic additives such as citric acid (CA) and ethylene glycol (EG) were added to aqueous precursor solution for indium, zinc, and tin. The obtained IZTO particles prepared by spray pyrolysis from the aqueous solution without organic additives had spherical and filled morphologies, whereas the IZTO particles obtained with organic additives had more hollow and porous morphologies. The micron-sized IZTO particles with organic additives were changed fully to nano-sized IZTO particles, whereas the micron-sized IZTO particles without organic additives were not changed fully to nano-sized IZTO particle after post-treatment at 700 °C for 2 hours and wet-ball milling for 24 hours. Surface resistances of micron-sized IZTO’s before post-heat treatment and wet-ball milling were much higher than those of nano-sized IZTO’s after post-heat treatment and wet-ball milling. From IZTO with composition of 80 wt. % In2O3, 10 wt. % ZnO, and 10 wt. % SnO2 which showed a smallest surface resistance IZTO after post-heat treatment and wet-ball milling, thin films were deposited on glass substrates by pulsed DC magnetron sputtering, and the electrical and optical properties were investigated.

Graphene oxide (GO) has received a lot of attention in membrane science for its CO2-philic nature, which can facilitate CO2 separation performance. In addition, GO has attractive properties for gas separation membrane material due to thin-film membrane formation and tunable transport channel. GO membrane can be generally prepared by coating GO nanosheets on microporous polymer supports for mechanical stability. However, the substrates for in thin GO layer should be carefully chosen for good adhesion between GO layer and support surface with maintaining good separation performance. In this study, we tried to modify the surface properties of high permeable support membranes by using gutter layer as an intermediate layer, and measured the gas transport properties of these GO thin-film composite membranes.

Cyclodextrin-graphene oxide film on the carbon nanotubes matrix is synthesized by a simple chemical method, and physical, chemical, and electrochemical properties of the composites are investigated. Capacitance is improved markedly up to 84 F/g with chemically reduced graphene oxide at the current density of 0.7 A/ g compared with 2.6 F/g of the previous composites having no graphene oxide. The new composites electrodes show more redox processes, originated from the graphene oxide, in the cycle voltammetry compared to the previous composites which had no graphene oxide, indicating enhancement of capacitances. Following improved energy density of the new composite makes it possible to be an electrode of the hybrid capacitors.

Thin film electrode consisting purely of porous anodic tin oxide with well-defined nano-channeled structure was fabricated for the first time and its electrochemical properties were investigated for application to an anode in a rechargeable lithium battery. To prepare the thin film electrode, first, a bi-layer of porous anodic tin oxides with well-defined nano-channels and discrete nano-channels with lots of lateral micro-cracks was prepared by pulsed and continuous anodization processes, respectively. Subsequent to the Cu coating on the layer, well-defined nano-channeled tin oxide was mechanically separated from the specimen, leading to an electrode comprised of porous tin oxide and a Cu current collector. The porous tin oxide nearly maintained its initial nano-structured character in spite of there being a series of fabrication steps. The resulting tin oxide film electrode reacted reversibly with lithium as an anode in a rechargeable lithium battery. Moreover, the tin oxide showed far more enhanced cycling stability than that of powders obtained from anodic tin oxides, strongly indicating that this thin film electrode is mechanically more stable against cycling-induced internal stress. In spite of the enhanced cycling stability, however, the reduction in the initial irreversible capacity and additional improvement of cycling stability are still needed to allow for practical use.

Tin oxide thin films were prepared on borosilicate glass by rf reactive sputtering at different deposition powers, process pressures and substrate temperatures. The ratio of oxygen/argon gas flow was fixed as 10 sccm / 60 sccm in this study. The structural, electrical and optical properties were examined by the design of experiment to evaluate the optimized processing conditions. The Taguchi method was used in this study. The films were characterized by X-ray diffraction, UV-Vis spectrometer, Hall effect measurements and atomic force microscope. Tin oxide thin films exhibited three types of crystal structures, namely, amorphous, SnO and SnO2. In the case of amorphous thin films the optical band gap was widely spread from 2.30 to 3.36 eV and showed n-type conductivity. While the SnO thin films had an optical band gap of 2.24-2.49 eV and revealed p-type conductivity, the SnO2 thin films showed an optical band gap of 3.33-3.63 eV and n-type conductivity. Among the three process parameters, the plasma power had the most impact on changing the structural, electrical and optical properties of the tin oxide thin films. It was also found that the grain size of the tin oxide thin films was dependent on the substrate temperature. However, the substrate temperature has very little effect on electrical and optical properties.

Transparent conducting aluminum-doped ZnO thin films were deposited using a sol-gel process. In this study, the important deposition parameters were investigated thoroughly to determine the appropriate procedures to grow large area thin films with low resistivity and high transparency at low cost for device applications. The doping concentration of aluminum was adjusted in a range from 1 to 4 mol% by controlling the precursor concentration. The annealing temperatures for the pre-heat treatment and post-heat treatment was 250˚C and 400-600˚C, respectively. The SEM images show that Al doped and undoped ZnO films were quite uniform and compact. The XRD pattern shows that the Al doped ZnO film has poorer crystallinity than the undoped films. The crystal quality of Al doped ZnO films was improved with an increase of the annealing temperature to 600˚C. Although the structure of the aluminum doped ZnO films did not have a preferred orientation along the (002) plane, these films had high transmittance (> 87%) in the visible region. The absorption edge was observed at approximately 370 nm, and the absorption wavelength showed a blue-shift with increasing doping concentration. The ZnO films annealed at 500˚C showed the lowest resistivity at 1 mol% Al doping.

Oxide semiconductors Thin-film transistors are an exemplified one owing to its excellent ambient stability and optical transparency. In particular zinc oxide (ZnO) has been reported because It has stability in air, a high electron mobility, transparency and low light sensitivity, compared to any other materials. For this reasons, ZnO TFTs have been studied actively. Furthermore, we expected that would be satisfy the demands of flexible display in new generation. In order to do that, ZnO TFTs must be fabricated that flexible substrate can sustain operating temperature. So, In this paper we have studied low-temperature process of zinc oxide(ZnO) thin-film transistors (TFTs) based on silicon nitride (SiNx)/cross-linked poly-vinylphenol (C-PVP) as gate dielectric. TFTs based on oxide fabricated by Low-temperature process were similar to electrical characteristics in comparison to conventional TFTs. These results were in comparison to device with SiNx/low-temperature C-PVP or SiNx/conventional C-PVP. The ZnO TFTs fabricated by low-temperature process exhibited a field-effect mobility of 0.205 cm2/Vs, a thresholdvoltage of 13.56 V and an on/off ratio of 5.73×106. As a result, We applied experimental for flexible PET substrate and showed that can be used to ZnO TFTs for flexible application.

Oxide effects experiments on massive hydriding reactions of Zr alloy with hydrogen gas were carried out at 400˚C under 1 atm in a H2 environment with a thermo-gravimetric apparatus (TGA). Experimental results for oxide effects on massive hydriding kinetics show that incubation time is not proportional to oxide thickness. The results also show that the massive hydriding kinetics of pre-filmed Zr alloys follows linear kinetic law and that the hydriding rates are similar to that of oxide-free Zr alloys once massive hydriding is initiated. Unlikely microstructure of the oxide during incubation time, physical defects such as micro-cracks and pores were observed in the oxide after incubation time. Therefore, it seems that the massive hydriding of Zr alloys can be ascribed to short circuit paths and mechanical or physical defects, such as micro-cracks and pores in the oxide, rather than to hydrogen diffusion through the oxide resulting from the increase of oxygen vacancies in the hypo-stoichiometric oxide.

코발트 산화물 박막을 전극으로 하여 Pt/Ti/Si 기판위에 Co3O4/LiPON/Co3O4로 구성된 전고상의 박막형 슈퍼캐패시터를 제작하였다. 각각의 Co3O4박막은 반응성 dc 마그네트론 스퍼터를 이용하여 O2/[Ar+O2] 비를 증가 시키며 성장시켰고, 비정질 LiPON 고체전해질 박막은 순수한 질소분위기 하에서 rf 스퍼터링으로 성장시켰다. 비록 벌크 타입의 슈퍼캐패시터에 비해 낮은 전기용량 (5-25mF/cm2-μm)을 가졌지만, Co3O4/LiPON/Co3O4 구조로 제작된 전고상 박막형 슈퍼캐패시터는 벌크 타입과 비슷한 거동을 나타내었다 0-2V의 전압구간, 50μA/cm2의 전류밀도에서 약 400사이클 까지 안정한 방전용량을 유지함을 관찰할 수 있었다 이러한 전고상 박막형 슈퍼캐패시터의 전기화학적 특성은 O2/[Ar+O2] 비에 의존하는데, 이러한 의존성을 구조적, 전기적 특성 및 표면특성을 분석하여 설명하였다.

50/50 vol% LSM-YSZ (La1-xSrxMnO3-yttria stabilized zirconia)의 복합공기극이 콜로이드 증착법에 의해 연마된 YSZ 전해질상에 증착되었다. 그 전극 특성은 주사전자현미경, X선회절과 임피던스 분석기에 의해 연구되어졌다. 900˚C에서 공기/LSM -YSZ/YSZ/Pt/공기 셀에 대해 측정된 전형적인 임피던스 스펙트럼들은 2개의 불완전한 호(depressed arc)로 구성되었다. LSM 전극에 대한 YSZ의 첨가는 전극내의 삼상계(TPB) 영역을 증가시켰으며, 이것이 LSM-YSZ 복합공기극의 비저항을 감소시켰다. 또한 전해질 표면의 불순물 제거와 TPB 길이의 증가를 위한 전해질 표면연마는 공기극의 비저항을 훨씬 더 감소시켰다. LSM-YSZ 공기극의 비저항은 작동온도, 공기극의 조성과 입자크기, 인가전류 및 전해질의 표면거칠기에 의해 큰 영향을 받았다.

고체 산화물 연료전지의 전해질로 주로 사용되는 8mol.%Y2O3-ZrO2는 전기 전도성은 우수하나 기계적 특성이 좋지 못하므로, 전기적 특성과 기계적 특성이 동시에 우수한 고체산화물 연료전지의 전해질의 개발이 요구되고 있다. 본 연구는 이러한 두 가지 요구조건을 충족시키기 위해서 수행되어졌다. 단위전지의 공기극 재료인 LSM(La(sub)0.75Sr(sub)0.25MnO3) 기판과 Si wafer를 기판으로 기계적 성질이 우수한 3mol.%의 YSZ(3-YSZ)와 전기 전도성이 우수한 8mol.%의 YSZ(8-YSZ)를 각각 단층 및 다층 박막의 네 가지 형태로 전자빔 코팅에 의해 전해질 막을 제작하였다. 박막층의 분석결과, 결정조직은 증착된 3-YSZ 박막의 정방정 및 일부 단사정 구조, 8-YSZ 박막은 입방정 구조의 결정성이 나타났다. 단층막 보다 다층막이 낮은 내부 응력을 보였으며, 다층막이 기존의 8-YSZ 단층막의 열처리 전, 후와 비슷한 미세 경도 값을 보였다.

본 연구에서는 PET(PentaEthoxy Tanatalum:Ta(OC2H5)5) 유기금속 화합물 전구체를 사용하여 차세대 초고집적회로 제조시 고유전체 물질로 유망한 Ta2O5 박막을 열화학증착 방법에 의하여 증착하였다. 본 증착실험을 통하여 여러 가지 운속기체, 기판온도, 반응압력 등의 공정변수가 층덮힘에 미치는 영향을 고찰하였으며 Monte Carlo 전산모사 결과와 기판온도 변화에 따른 층덮힘 패턴의 변화에 대한 실험결과를 비교하여 부착계수를 산출하였다. 운송기체로는 N2, Ar, He을 바꿔가며 실험하였으며 He>N2>Artns으로 층덮힘이 양호한 것으로 나타났다. 이는 운송기체의 종류에 따라 운동량 확산도, 열 확산도, 물질 확산도 등의 이동현상 특성값들이 다르기 때문이라 생각된다. 기판온도의 증가는 운송기체의 종류에 관계없이 층덮힘을 악화시켰으며 도랑내부에서의 Knudsen 확산과 표면반응물의 탈착에 비해 표면반응이 보다 지배적인 역할을 담당함을 알 수 있었다. 또한 질소를 운송기체로 사용한 경우에 부착계수의 겉보기 활성화 에너지는 15.9Kcal/mol로 나타났다. 그리고 3Torr 이하에서 반응압력이 증가하는 반응압력이 증가하는 경우에는 물질 확산도의 감소 효과 때문에 층덮힘이 악화되었다. 본 연구결과 3Torr, 350˚C에서 He 운송기체를 이용한 경우가 가장 우수한 층덮힘을 얻을 수 있는 최적 공정 조건임을 알 수 있었다.

Ta2O5박막은 고유전율의 특성으로 차세대 DRAM캐패시터 물질로 유망받고 있는 물질이다. 본 연구에서는 p-type(100)Si 웨이퍼 위에 열 MOCVD 방법으로 Ta2O5박막을 성장시켰으며 기판온도, 버블러 온도, 반응압력의 조업조건이 미치는 영향을 고찰하엿다. 증착된 박막은 SEM, XRD, XPS, FT-IR, AES, TEM, AFM을 이용하여 분석하였으며 질소나 산소 분위기의 furnace 열처리 (FA)와 RTA(Rapid Thermal Annealing)를 통하여 열처리 효과를 살펴보았다. 반응온도에 따른 증착속도는 300 ~ 400 ˚C 범위에서 18.46kcal/mol의 활성화 에너지를 가지는 표면반응 율속단계와 400 ~ 450˚C 범위에서 1.9kcal/mol의 활성화 에너지를 가지는 물질전단 율속단계로 구분되었다. 버블러 온도는 140˚C일때 최대의 증착속도를 보였다. 반응압력에 따른 증착속도는 3torr에서 최대의 증착속도를 보였으나 굴절율은 0.1-1torr사이에 Ta2O5의 bulk값과 비슷한 2.1정도의 양호한 값이 얻어졌다. 400˚C에서 층덮힘은 85.71%로 매우 양호하게 나타났으며 몬테카를로법에 의한 전산모사 결과와의 비교에 의해서 부착계수는 0.06으로 나타났다. FT-IR, AES, TEM 분석결과에 의하여 Si와 Ta2O5 박막 계면의 산화막 두께는 FA-O2 > RTA-O2 ~ FA-N2 > RTA-N2 순으로 성장하였다. 하지만 질소분위기에서 열처리한 박막은 산소분위기의 열처리경우에 비해 박막내의 산소성분의 부족으로 인한 그레인 사이의 결함이 많이 관찰되었다.