In this paper, the key assembly of the recently developed light machine gun-Ⅱ sighting device was identified as prone to experiencing horizontal noise caused by unstable voltage fluctuations under high-temperature conditions during the defense environmental stress screening test. The primary objective ot this study is to address the issue of horizontal noise through circuit analysis and device parameter tuning, aiming to eliminate its presence.

• 박준영(국방기술품질원 지휘정찰센터) | 박준영
• 최재인(국방기술품질원) | 최재인
• 김성준 (한화시스템 생산기술부) | Sung-Jun Kim
• 강경선(국방기술품질원) | 강경선