WDM(Wavelength Division Multiplexing) is called a wavelength division multiplexing optical transmission method and is a next-generation optical transmission technology. Case company F has recently developed and sold PLC(Planar Lightwave Circuit), a key element necessary for WDM system production. Although Chinese processing companies are being used as a global outsourcing strategy to increase price competitiveness by lowering manufacturing unit prices, the average defect rate of products manufactured by Chinese processing companies is more than 50%, causing many problems. However, Chinese processing companies are trying to avoid responsibility, saying that the cause of the defect is the defective PLC Wafer provided by Company F. Therefore, in this study, the responsibility of the PLC defect is clearly identified through estimating the defect rate of PLC using the sampling inspection method, and the improvement plan for each cause of the PLC defect for PLC yeild improvement is proposed. The result of this research will greatly contribute to eliminating the controversy over providing the cause of defects between global outsourcing companies and the head office. In addition, it is expected to form a partnership with Company F and a Chinese processing company, which will serve as a cornerstone for successful global outsourcing. In the future, it is necessary to increase the reliability of the PLC yield calculation by extracting more precisely the number of defects.

효과적으로 공정을 관리하기위하여 제품의 품질특성치에 영향을 주는 데이터를 수집하고 공정을 해석하여한다. 이를 위해서 데이터 마이닝(Data Mining)이 많이 수행되어지고 있다. 본 연구에서는 공정으로부터 수집된 대량의 정보 데이터를 신경망(Neural Network)기법을 통하여 공정의 불량률을 예측하고 불량률이 높게 나타난 데이터를 통해 연관규칙(Association Rule)을 적용하여 불량에 영향을 주는 공정의 패턴을 파악 공정을 개선하고자 한다.