Semiconductor processes are mainly divided into FAB process, package and test. The FAB process is promoting smart factories over a long period of time. The situation of the package and test process is manual, but there is a wafer testing process that prepares the latest topic "SmartFactory". The purpose of this study is to study the key variables for the completion of the material allocation scheduling system which will be the base environment of the smart factory in the wafer test process and to build the system based on the designed research model.