This paper provided the information related to the removal of 2,4,6-tribromophenol using in-situ and stable liquid ferrates(VI). This research’s goal was to observe the differences of oxidation power between in-situ liquid ferrate(VI) and stable liquid ferrate(VI). The in-situ liquid ferrate(VI) (FeO4 2-) has been successfully produced with the concentration 42,000 ppm (Fe) after 11 minutes of reaction time. The stable liquid ferrate(VI) was also successfully produced following the modification method by Sharma with the produced concentrations 7,000 ppm. The stable liquid ferrate(VI) was stable for 44 days and slightly decreased afterwards. This research has been carried out using 2,4,6-tribromophenol as the representative compound. Both of ferrates(VI) have the highest oxidation capability at the neutral condition. Furthermore, the stable liquid ferrate(VI) has higher oxidation power than the in-situ liquid ferrate(VI).

Various morphologies of copper oxide (CuO) have been considered to be of both fundamental and practical importance in the field of electronic materials. In this study, using Cu (0.1 μm and 7 μm) particles, flake-type CuO particles were grown via a wet oxidation method for 5min and 60min at 75 oC. Using the prepared CuO, AlN, and silicone base as reagents, thermal interface material (TIM) compounds were synthesized using a high speed paste mixer. The properties of the thermal compounds prepared using the CuO particles were observed by thermal conductivity and breakdown voltage measurement. Most importantly, the volume of thermal compounds created using CuO particles grown from 0.1 μm Cu particles increased by 192.5% and 125 % depending on the growth time. The composition of CuO was confirmed by X-ray diffraction (XRD) analysis; cross sections of the grown CuO particles were observed using focused ion beam (FIB), field emission scanning electron microscopy (FE-SEM), and energy dispersive analysis by X-ray (EDAX). In addition, the thermal compound dispersion of the Cu and Al elements were observed by X-ray elemental mapping.