본 연구는 의사결정 전에 행복을 느끼는 소비자와 슬픔을 느끼는 소비자 간에 자기타당화 정도의 차이와 규제초점의 차이 그리고 자기타당화 정도의 차이가 규제초점과 정보왜곡에 미치는 영향을 탐색하였다. 연구 결과, 첫째, 사전에 행복을 느낀 소비자는 사전에 슬픔을 느낀 소비자보다 자기타당화 정도가 크고, 촉진초점을 강하게 갖는다. 둘째, 사전에 느낀 슬픔감정과 비교하여 사전에 느낀 행복감정이 자기타당화를 매개로 촉진초점에 부분적으로 정적인 영향을 미치고, 자기타당화를 매개로 정보왜곡에 완전히 정적인 영향을 미친다. 본 연구는 현재의 의사결정시점 이전에 느낀 행복감정과 슬픔감정 간에 촉진초점 정도와 자기타당화 정도의 차이, 자기타당화의 정보왜곡 효과를 탐색하여 이론적으로 기여하고 있다. 이에 따라 마케팅 관리자는 소비자의 자사의 제품에 대한 사고 확신성을 높여 소비자의 자기타당화를 촉진하고, 또 촉진초점을 유도하기 위해 사전에 소비자가 행복감정을 느끼도록 해야 함을 관리적 시사점으로 제시하였다.

To increase the capacitance of an Al electrolytic capacitor, the anodic oxide film, Al2O3, was partly replaced by an Al2O3-ZrO2 (Al-Zr) composite film prepared by the vacuum infiltration method and anodization. The microstructure and composition of the prepared samples were investigated by scanning electron microscopy and transmission electron microscopy. The coated and anodized samples showed multi-layer structures, which consisted of an inner Al hydrate layer, a middle Al- Zr composite layer, and an outer Al2O3 layer. The thickness of the coating layer could go up to 220 nm when the etched Al foil was coated 8 times. The electrical properties of the samples, such as specific capacitance, leakage current, and withstanding voltages, were also characterized after anodization at 100 V and 600 V. The capacitances of samples with ZrO2 coating were 36.3% and 27.5% higher than those of samples without ZrO2 coating when anodized at 100 V and 600 V, respectively.

The oxide films formed on etched aluminum foils play an important role as dielectric layers in aluminum electrolytic capacitors. Y2O3-doped ZrO2 (YZ) films were coated on the etched aluminum foils by sol-gel dip coating, and the electrical properties of YZ-coated Al foils were characterized. YZ films annealed at 450 oC were crystallized into a cubic phase, and as the Y2O3 doping content increased, the unit cell of ZrO2 expanded and the grain size decreased. The etch pits of Al foils were filled by YZ sol when it dried at atmospheric pressure after repeating for several times, but this step could essentially be avoided when being dried in a vacuum. YZ-coated foils indicated that the specific capacitance and dissipation factor were 2-2.5 μF/cm2 and 2-4 at 1 kHz, respectively, and the leakage current and withstanding voltage of films approximately 200 nm thick were 5 × 10−4A at 21 V and 22 V, respectively. After being anodized at 500 V, the foils exhibited a specific capacitance and dissipation factor of 0.6-0.7 μF/cm2 and 0.1-0.2, respectively, at 1 kHz, while the leakage current and withstanding voltage were 2 × 10−4 - 3 × 10−5 A at 400 V and 420-450 V, respectively. This suggests that YZ film is a promising dielectric that can be used in high voltage Al electrolytic capacitors.

ZrO2 films were coated on aluminum etching foil by the sol-gel method to apply ZrO2 as a dielectric material in an aluminum(Al) electrolytic capacitor. ZrO2 films annealed above 450˚C appeared to have a tetragonal structure. The withdrawal speed during dip-coating, and the annealing temperature, influenced crack-growth in the films. The ZrO2 films annealed at 500˚C exhibited a dielectric constant of 33 at 1 kHz. Also, uniform ZrO2 tunnels formed in Al etch-pits 1μm in diameter. However, ZrO2 film of 100-200 nm thickness showed the withstanding voltage of 15 V, which was unsuitable for a high-voltage capacitor. In order to improve the withstanding voltage, ZrO2-coated Al etching foils were anodized at 300 V. After being anodized, the Al2O3 film grew in the directions of both the Al-metal matrix and the ZrO2 film, and the ZrO2-coated Al foil showed a withstanding voltage of 300 V. However, the capacitance of the ZrO2-coated Al foil exhibited only a small increase because the thickness of the Al2O3 film was 4-5 times thicker than that of ZrO2 film.