Recently, the necessity of designing and applying tool materials that perform machining of difficult-to-cut materials in a cryogenic treatment where demand is increasing. The objective of this study is to evaluate the performance of cryogenically treated WC-5 wt% NbC hard materials fabricated by a pulsed current activated sintering process. The densely consolidated specimens are cryogenically exposed to liquid nitrogen for 6, 12, and 24 h. All cryogenically treated samples exhibit compressive stress in the sintered body compared with the untreated sample. Furthermore, a change in the lattice constant leads to compressive stress in the specimens, which improves their mechanical performance. The cryogenically treated samples exhibit significant improvement in mechanical properties, with a 10.5 % increase in Vickers hardness and a 60 % decrease in the rupture strength compared with the untreated samples. However, deep cryogenic treatment of over 24 h deteriorates the mechanical properties indicating that excessive treatment causes tensile stress in the specimens. Therefore, the cryogenic treatment time should be controlled precisely to obtain mechanically enhanced hard materials.

Using lanthanum zinc oxide (LZO) film with the ion-beam irradiation, uniform and homogeneous liquid crystal (LC) alignment was achieved. To fabricate the LZO thin film on glass substrate, solution process was conducted as a deposition method. Cross-polarized optical microscopy (POM) and the crystal rotation method reveal the state of LC alignment on the ion-beam irradiated LZO film. Between orthogonally placed polarizers, POM image showed constant black color with regular transmittance. Furthermore, collected incidence angle versus transmittance curve from the crystal rotation method revealed that the LC molecules on the ion-beam irradiated LZO film were aligned homogeneously. Atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS) were conducted to reveal the relationship between the ion-beam irradiation and the LC alignment. The ion-beam irradiation changed the LZO film surface to rougher than before by etching effect. Numerical roughness values from AFM analysis supported this phenomenon specifically. XPS analysis showed the chemical composition change due to the ion-beam irradiation by investigation of O 1s, La 3d and Zn 2p spectra. The ion-beam irradiation induced the breakage of chemical bonds in the LZO film surface and this occurred surface chemical anisotropic characteristics for uniform LC alignment.