This paper treats accelerated life tests for automotive connector. The contact resistance of connector is explained by some factors; the use time(calender time, real cycle), stresses and loads adapted in auto test. The relationships between contact resistance and some factors are compared and analyzed by regression models in various test conditions; field use-environment, manufacturer's test environment, and accelerated test condition. The consistency between of manufacturer's test and field test is examined. Finally, the future study on accelerated test for automotive connector is presented.

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, S, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, θ is a random variable of environments and a function of probabilistic stress. In detail, it is assumed that the hazard rate is linear function of the stress, the general stress distribution is a gamma distribution and the life distribution for the given hazard rate, θis an exponential distribution. Maximum likelihood estimators of model parameters are obtained, and the mean life in use stress condition is estimated. A hypothetical example is given to show its applicability.

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, Sj, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, ,thetaj, is the random variable of environments and the function of probabilistic stress. Also it is assumed that the general stress distribution is uniform, the life distribution for the given hazard rate, θ, is exponential and inverse power law model holds. In this paper, we obtained maximum likelihood estimators of model parameters and the mean life in use stress condition.