Odorous pollutants emitted from the manufacturing process of TFT-LCD were investigated to prepare the odor control plan. Odor measurements in the workplace of clean room were also carried out. The odorous pollutants detected in the organic and acid gas emission duct were acetone, acetic acid, IPA, nbutylacetate, PGMEA, cyclohexane, which were chemicals used for LCD manufacturing. Especially, acetic acid was turned out to one of the major odor substances in the acid gas emission duct because of its low odor threshold value. No odorous pollutants were detected in the toxic gas emission duct. Some organic gases detected in the clean room were due to the leakage from chemical containers or LCD devices.

TFT-LCD is the most popular type of flat display panel in the information technology field. The back light unit is a main part of the structure of a TFT-LCD panel. Occasionally, studies have shown that failures of the CCFL of the BLU occur due to the poor weld characteristics of these materials. The aim of this study was to prepare some technical data and to characterize a microjoined electrode for the CCFL. Microstructure examinations, microhardness measurements, resistance measurements and microtensile tests of the microjoined electrode were carried out. The result indicates that a large amount of grain coarsening exists in the heat-affected zone (HAZ) of the weld between the cup and the pin. This grain coarsening of the HAZ between the cup and pin is caused by the welding cycle, which may have an influence on the lowest microhardness values. Fracturing of the microjoined electrode also occurred at the HAZ close to the cup between the weld holding the cup and the pin. Additionally, no specific changes of the electrical resistance among the cup, pin, and lead wire themselves or in the microjoined electrode were observed.

In this paper, we propose a systematic procedure to determine standard time and cycle time in a TFT-LCD factory. The proposed procedure mainly consists of data preprocessing, hypothesis testing and Group technology. Data preprocessing extracts relevant da

The number of pixel defects including bright and black dots on a panel is one of the critical factors determining the quality of TFT-LCD. Since pixel defects on the TFT-LCD panels are sometimes unavoidable, manufacturers have to inspect the panels so that any panel with an unacceptable number of defects will not be delivered to the buyers. However, the buyers demand for the manufacturers to meet different pixel defects tolerances (acceptable number of pixel defects on a TFT-LCD panel) around central(tight) and peripheral(loose) inspection zones. The disagreement in quality standard among different buyers also cause confusions in screening non-confirmative products and unstable yield of production. Few research has focused on the effects of defect locations on a TFT-LCD panel on their detection probabilities and the rational division of defect inspection zones. In this research, experiments were conducted to find the detection probabilities of black dot defects with respect to their varying locations on a TFT-LCD. It is proposed a rational division of inspection zone on a TFT-LCD panel on the basis of detection probabilities of the defects. With these division of inspection zones and the mean defect detection probability within each zone, it is expected to establish a more reasonable pixel defects tolerances.