The high-level nuclear waste (HLW) repository is a 500-1,000 m deep geological disposal system with a very long life expectancy for disposing of high-level waste, which is known to have a half-life of several thousand years. This repository is subject to harsh environmental conditions, such as high temperature and radiation from high-level waste, that can cause deterioration and crack. When radiation escapes through cracks, it can injure persons on the ground. Therefore, it is essential to install a sensor that can detect problems such as cracks. But, since the high-level nuclear waste (HLW) repository is sealed with bentonite and backfill, the sensor cannot be removed or replaced once it has been installed. Therefore, it is necessary to develop a highly durable monitoring sensor that can withstand harsh environmental conditions. Before attempting to improve durability, it is first required to assess durability quantitatively. And an accelerated life test is a widely used method for assessing durability. However, it is important to obtain the same failure mode when conducting a reliability test, such as an accelerated life test. If the accelerated life test is conducted using different failure modes, the dependability of the results is inevitably diminished. Therefore, in this study, a representative failure mode for the piezoelectric sensor used in the accelerated life test was derived through experiments and literature research.

Since guided missiles with the characteristics of the one-shot system remain stored throughout their entire life cycle, it is important to maintain their storage reliability until the launch. As part of maintaining storage reliability, period of preventive test is set up to perform preventive periodic test, in this case failure detection rate has a great effect on setting up period of preventive test to maintain storage reliability. The proposed method utilizes failure rate predicted by the software on the basis of MIL-HDBK-217F and failure mode analyzed through FMEA (Failure Mode and Effect Analysis) using data generated from the actual field. The failure detection rate of using the proposed method is applied to set periodic test of the actual guided missile. The proposed method in this paper has advantages in accuracy and objectivity because it utilizes a large amount of data generated in the actual field.

Many automotive components for power generation such as motors and alternators have been widely using ferrite magnets. To ensure a high level of efficiency could be achieved in an alternator, the assembled magnets must be in good enough durability. Recently, some hairline cracks have been found on the magnet produced by manufacturers in Korea. Thus, there is an increasing concern that some of the magnets produced could cause further problems after being assembled in the alternator. Based on the standard alternator test (RS0008 : 2006), this paper has developed an accelerated failure-free test for magnets in alternator to demonstrate that assembled magnets will meet durability objective specified by the manufacturer. This guarantees the target life of the magnet with 90 percent reliability and 90 percent confidence level (R90C90). Temperature and rotation speed were selected as accelerated stress factors.

방사성물질 운반용기는 가상 사고조건에서 구조적 건전성이 유지됨을 실험 및 수치해석을 통해 입증하여야 한다. 가상 사고조건에 포함되는 파열낙하 조건에 대한 기존 유한요소해석의 경우 충격완충체에서 재료의 파손이 발생하기 때문에 일반적으로 유한요소모델에서 이 부분을 무시하고 해석한다. 본 논문에서는 파열낙하 해석에서 충격완충체의 변형으로 인한 낙하에너지 흡수의 효과를 고려하기 위해 요소의 적분점에서 응력이나 변형율이 재료의 파손 기준치에 도달하면 그 요소를 제거하는 방법을 제안한다. 본 해석방법의 효용성을 보이기 위해 한국원자력연구원에서 설계중인 핫셀 운반용기에 대해 파열낙하 해석을 수행하였으며, 요소제거 기법의 적용을 통해 낙하 에너지의 80% 정도가 충격완충체에서 흡수되는 것으로 계산되었다. 본 해석방법은 시험조건에 비해 보수성을 가지는 평가방법이며, 기존의 해석방법과 비교해 파열낙하 조건을 보다 근사적으로 해석할 수 있는 방법이다.

BGA test sockets failed earlier than the expected life-time due to abnormal signal delay, shown especially at the low temperature (-50˚C). Analysis of failed sockets was conducted by EDX, AES, and XRD. A SnO layer contaminated with C was found to form on the surface of socket pins. The formation of SnO layer was attributed to the repeated Sn transfer from BGA balls to pin surface and instant oxidation of fresh Sn. As a result, contact resistance increased, inducing signal delay. Abnormal signal delay at the low temperature was attributed to the increasing resistivity of Sn oxide with decreasing temperature, as manifested by the resistance measurement of SnO2.