4H- and 6H-SiC grown by physical vapor transport method were investigated by transmission electron microscopy (TEM). From the TEM diffraction patterns observed along the [11-20] zone axis, 4H- and 6H-SiC were identified due to their additional diffraction spots, indicating atomic stacking sequences. However, identification was not possible in the [10-10] zone axis due to the absence of additional diffraction spots. Basal plane dislocations (BPDs) were investigated in the TEM specimen prepared along the [10-10] zone axis using the two-beam technique. BPDs were two Shockley partial dislocations with a stacking fault (SF) between them. Shockley partial BPDs arrayed along the [0001] growth direction were observed in the investigated 4H-SiC. This arrayed configuration of Shockley partial BPDs cannot be recognized from the plan view TEM with the [0001] zone axis. The evaluated distances between the two Shockley partial dislocations for the investigated samples were similar to the equilibrium distance, with values of several hundreds of nanometers or even values as large as over a few micrometers.

This study suggested comprehensive structural characterization methods for the commercial blue light emitting diodes(LEDs). By using the Z-contrast intensity profile of Cs-corrected high-angle annular dark field scanning transmission electron microscope(HAADF-STEM) images from a commercial lateral GaN-based blue light emitting diode, we obtained important structural information on the epilayer structure of the LED, which would have beendifficult to obtain by conventional analysis. This method was simple but very powerful to obtain structural and chemical information on epi-structures in a nanometer-scale resolution. One of the examples was that we could determine whether the barrier in the multi-quantum well(MQW) was GaN or InGaN. Plan-view TEM observations were performed from the commercial blue LED to characterize the threading dislocations(TDs) and the related V-pit defects. Each TD observed in the region with the total LED epilayer structure including the MQW showed V-pit defects for almost of TDs independent of the TD types: edge-, screw-, mixed TDs. The total TD density from the region with the total LED epilayer structure including the MQW was about 3.6 × 108 cm−2 with a relative ratio of Edge- : Screw- :Mixed-TD portion as 80%: 7%: 13%. However, in the mesa etched region without the MQW total TD density was about 2.5 × 108 cm−2 with a relative ratio of Edge- : Screw- :Mixed TD portion of 86%: 5%: 9 %. The higher TD density in the total LED epilayer structure implied new generation of TDs mostly from the MQW region.

This study used transmission electron microscopy (TEM) to investigate the micro-morphological features of two formaldehyde to urea (F/U) mole ratio liquid urea-formaldehyde (UF) resins with three hardener levels as a function of the curing time. The micro-morphological features of the liquid UF resins were characterized after different curing times. As a result, the TEM examination revealed the presence of globular/nodular structures in both liquid UF resins, while spherical particles were only visible in the low F/U mole ratio resins. The high F/U mole ratio liquid UF resins also showed extensive particle coalescence after adding the hardener, along with the appearance of complex filamentous networks. When the resins were cured with a higher amount of hardener and longer curing time, the spherical particles disappeared. For the low mole UF resins, the particles tended to coalesce with a higher amount of hardener and longer curing time, although discrete spherical particles were still observed in some regions. This is the first report on the distinct features of the crystal structures in low F/U mole ratio UF resins cured with 5% hardener and after 0.5 h of curing time. In conclusion, the present results indicate that the crystal structures of low F/U mole ratio UF resins are formed during the curing process.

In this work, we report in-situ observations of changes in catalyst morphology, and of growth termination of individual carbon nanotubes (CNTs), by complete loss of the catalyst particle attached to it. The observations strongly support the growth-termination mechanism of CNT forests or carpets by dynamic morphological evolution of catalyst particles induced by Ostwald ripening, and sub-surface diffusion. We show that in the tip-growth mode, as well as in the base-growth mode, the growth termination of CNT by dissolution of catalyst particles is plausible. This may allow the growth termination mechanism by evolution of catalyst morphology to be applicable to not only CNT forest growth, but also to other growth methods (for example, floating-catalyst chemical vapor deposition), which do not use any supporting layer or substrate beneath a catalyst layer.

MBS에 의해(001)GaAs기판 위에 성장된 Zn1-xCoxSe(x=1.0, 7.4, 9.5 %)반도체 박막과 (ZnSe/FeSe)반도체 초격자 박막의 미세구조를 투과전자현미경을 이용하여 연구하였다. Zn1-xCoxSe 박막 시편의 경우, 박막과 기판 사이의 격자 불일치때문에 a/2<110>형태의 버거즈 벡터를 가지는 부정합 전위를 관찰하였다. 모든 Zn1-xCoxSe 박막과 기판의 계면은 뚜렷이 구별되었고, 계면에서 산화물이나 이물질이 존재하지 않았다. 또한, (ZnSe/FeSe)초격자를 성장시키기 전에 GaAs기판 위에 ZnSe바닥층을 넣음으로써 고품질의 (ZnSe/FeSe)초격자를 얻었다. (ZnSe/FeSe)초격자에 있는 FeSe는 섬아연광 결정구조로 존재하였다.

고분해능 전자현미경과 컴퓨터 이미지 시뮬레이션이 La이 첨가되고 또한 첨가되지 않은 Pb(Mg/ sub 1/3/Nb23/)O3고용체의 미세구조를 연구하기 위해서 사용되었다. 불규칙격자 영역의 격자 이미지는 정방정 형태와 유사 육방정 형태를 각각 보였다. 규칙격자 영역에서 Mg과 Nb의 비화학양론적인 규칙격자 구조 현상이<111>방향에 따라 관찰되었다. 실험 격자 이미지와 컴퓨터 시뮬레이션 이미지의 비교로부터, 규칙격자 구조를 가지는 영역의 장거리 규칙도는 0.2-0.7의 값을 가지고 있었고, 또한 규칙격자는 (NH4)3FeF6결정구조를 가지고 있었다. 작은 값의 장거리 규칙도를 가지는 규칙격자를 가지는 영역에서, 변형률 파형이 관찰되지 않았다. 이것은 대부분 두 양이온이 그들의 위치에 있기 때문에, 원자 변위가 없었기 때문이다.

집속이온빔(FIB, focused ion beam)법은 광물 및 지질시료의 분석 대상 위치로부터 투과전자현 미경(TEM, transmission electron microscope) 관찰을 위한 박편을 정밀하게 제작할 수 있는 방법으로 널리 보급되고 있다. 그러나 박편 제작과정에서 Ga 이온빔에 의한 구조 손상이나 인위적 효과들이 발 생하여 전자빔에 의한 손상과 함께 TEM 분석에서의 난점들 중 하나이다. 광물 시료 FIB 박편의 TEM 관찰에서 석영과 장석의 비정질화, 커튼 효과, Ga 오염 등이 확인되었으며, 특히 입자 경계 부근 이나 두께가 얇은 곳에서 이들 현상이 보다 뚜렷하다. 박편 제작 시의 가속전압 및 전류 조정 등의 분 석절차 개선으로 이온빔 손상을 줄일 수 있으나, 어느 정도의 손상이나 오염은 피할 수 없으므로 TEM 박편 관찰과 해석에서 유의하여야 한다.

The dehydroxylation of kaolinite was investigated in detail by means of energy-filtering transmission electron microscope with both orientations parallel and perpendicular to c. The dehydroxylation could be characterized by the broad background including (0.211) band (20~24˚ 2θ) on X-ray diffraction and by the three halo rings (d-spacing : 3.28~4.40a (near (02,11) band), 2.41~245a (near (20,13) band), 1.16~1.23a (near (0.8,44) band)), and (02,11) and (20,13) spots on electron diffraction. These indicate existence of a short-range order along the a and b axes. Interplanar spacing of (001) is reduced to about 6.86a and the sharp additional intensity maximum of about 14.2a reveals that metakaolinite has a modulated structure along c axis. It is proposed that the modulated structure is attributed to the domains consisting of more than two-layers due to the changes of positions of the vacant octahedral sites in successive layers.