This study has assessed mechanical bonding strength of lead-free solder joint. Assessment methods was performing long-term reliability test about thermal shock, thermal life and high temperature & high humidity. Based on the results of analyzing mean values that was obtained from repetion of 5 times according to each conditions, reduction of mechanical bonding strength of each tests was confirmed. When it comes to HB chip, the order of high deviation rate was shown thermal shock, high temperature & humidity and thermal life. And the higher deviation rate of R0 is high temperature & humidity, thermal life and thermal shock. The order of high deviation rate of C1 chip is high temperature & humidity, thermal shock and thermal life. Related to this result of experiment, the most stable error range of mechanical bonding strength is established. From now on optimized quantity of solder and shape of solder-joint is needed by establishing a test method which can make error range of mechanical bonding strength minimize.

The effects of printed circuit board electroless nickel immersion gold (ENIG) and organic solderability preservative (OSP) surface finishes on the electromigration reliability and shear strength of Sn-3.5Ag Pb-free solder bump were systematically investigated. In-situ annealing tests were performed in a scanning electron microscope chamber at 130, 150, and 170˚C in order to investigate the growth kinetics of intermetallic compound (IMC). Electromigration lifetime and failure modes were investigated at 150˚C and 1.5×105A/cm2, while ball shear tests and failure mode analysis were conducted under the high-speed conditions from 10 mm/s to 3000 mm/s. The activation energy of ENIG and OSP surface finishes during annealing were evaluated as 0.84 eV and 0.94 eV, respectively. The solder bumps with ENIG surface finish showed longer electromigration lifetime than OSP surface finish. Shear strengths between ENIG and OSP were similar, and the shear energies decreased with increasing shear speed. Failure analysis showed that electrical and mechanical reliabilities were very closely related to the interfacial IMC stabilities.

In semiconductor manufacturing, the circuit integrity of packaged BGA devices is tested by measuring electrical resistance using test sockets. Test sockets have been reported to often fail earlier than the expected life-time due to high contact resistance. This has been attributed to the formation of Sn oxide films on the Au coating layer of the probe pins loaded on the socket. Similar to contact failure, and known as "fretting", this process widely occurs between two conductive surfaces due to the continual rupture and accumulation of oxide films. However, the failure mechanism at the probe pin differs from fretting. In this study, the microstructural processes and formation mechanisms of Sn oxide films developed on the probe pin surface were investigated. Failure analysis was conducted mainly by FIB-FESEM observations, along with EDX, AES, and XRD analyses. Soft and fresh Sn was found to be transferred repeatedly from the solder bump to the Au surface of the probe pins; it was then instantly oxidized to SnO. The SnO2 phase is a more stable natural oxide, but SnO has been proved to grow on Sn thin film at low temperature (< 150˚C). Further oxidation to SnO2 is thought to be limited to 30%. The SnO film grew layer by layer up to 571 nm after testing of 50,500 cycles (1 nm/100 cycle). This resulted in the increase of contact resistance and thus of signal delay between the probe pin and the solder bump.

In this study, we optimized Pb-free Sn/Ni plating thickness and conditions were optimized to counteract the environmental regulations, such as RoHS and ELV(End-of Life Vehicles). The B10 life verification method was also suggested to have been successful when used with the accelerated life test(ALT) for assessing Pb-free solder joint life of piezoelectric (PZT) ceramic resonator. In order to evaluate the solder joint life, a modified Norris-Landzberg equation and a Coffin-Manson equation were utilized. Test vehicles that were composed of 2520 PZT ceramic resonator on FR-4 PCB with Sn-3.0Ag-0.5Cu for ALT were manufactured as well. Thermal shock test was conducted with 1,500 cycles from (-40±2)˚C to (120±2)˚C, and 30 minutes dwell time at each temperature, respectively. It was discovered that the thermal shock test is a very useful method in introducing the CTE mismatch caused by thermo-mechanical stress at the solder joints. The resonance frequency of test components was measured and observed the microsection views were also observed to confirm the crack generation of the solder joints.

기존의 전자 기판에서 땜납으로 사용되고 있는 Sn-Pb계 합금을 대체하기 위한 새로운 합금을 개발하기 위하여 열역학을 이용한 상평형계산을 통해 얻은 다원계 상태도를 바탕으로 적정한 녹는점과 용융구간을 가지는 Sn-Bi-In-Zn계 솔더합금을 설계하였다. 설계된 합금을 제작하여 XRD, DSC및 EDX로 분석하여 상의 확인,조성분석 및 고상점과 액상점 등의 녹음 거동을 확인하였다. 또한 열처리에 따른 미세구조의 변화를 관찰하였고, 이러한 조직변화가 기계적 성질에 미치는 영향을 경도실험과 인장실험을 통해 연구하였다.