The most comprehensive and particularly reliable method for non-destructively measuring the residual stress of the surface layer of metals is the sin method. When X-rays were used the relationship of sin measured on the surface layer of the processing metal did not show linearity when the sin method was used. In this case, since the effective penetration depth changes according to the changing direction of the incident X-ray,  becomes a sin function. Since  cannot be used as a constant, the relationship in sin cannot be linear. Therefore, in this paper, the orthogonal function method according to Warren’s diffraction theory and the basic profile of normal distribution were synthesized, and the X-ray diffraction profile was calculated and reviewed when there was a linear strain (stress) gradient on the surface. When there is a strain gradient, the X-ray diffraction profile becomes asymmetric, and as a result, the peak position, the position of half-maximum, and the centroid position show different values. The difference between the peak position and the centroid position appeared more clearly as the strain (stress) gradient became larger, and the basic profile width was smaller. The weighted average strain enables stress analysis when there is a strain (stress) gradient, based on the strain value corresponding to the centroid position of the diffracted X-rays. At the 1/5 max height of X-ray diffraction, the position where the diffracted X-ray is divided into two by drawing a straight line parallel to the background, corresponds approximately to the centroid position.

Lately, Raman spectroscopy has become powerful tool for quality assessment of graphene analogues with identification of intensity ratio of Raman active D-band and G-band ( ID/IG ratio) as a vital parameter for quantification of defects. However, during chemical reduction of graphitic oxide (GrO) to reduced GrO (RGrO), the increased ID/ IG ratio is often wrongly recognized as defect augmentation, with “formation of more numerous yet smaller size sp2 domains” as its explanation. Herein, by giving due attention to normalized peak height, full-width half-maxima and integrated peak area of Raman D- and G-bands, and compliment the findings by XRD data, we have shown that in-plane size of sp2 domains actually increases upon chemical reduction. Particularly, contrary to increased ID/ IG ratio, the calculated decrease in integrated peak area ratio ( AD/AG ratio) in conjunction with narrowing of D-band and broadening of G-band, evinced the decrease in in-plane defects. Finally, as duly supported by reduction induced broadening of interlayer-spacing characteristic XRD peak and narrowing of ~ 43° centered XRD hump, we have also shown that the sp2 domains actually expands in size and the observed increase in ID/ IG ratio is indeed due to increase in across-plane defects, formed via along-the-layer slicing of graphitic domains.

As a case study on aspect ratio behavior, Kaolin, zeolite, TiO2, pozzolan and diatomaceous earth minerals are investigated using wet milling with 0.3 pai media. The grinding process using small media of 0.3 pai is suitable for current work processing applications. Primary particles with average particle size distribution D50, ~6 μm are shifted to submicron size, D50 ~0.6 μm, after grinding. Grinding of particles is characterized by various size parameters such as sphericity as geometric shape, equivalent diameter, and average particle size distribution. Herein, we systematically provide an overview of factors affecting the primary particle size reduction. Energy consumption for grinding is determined using classical grinding laws, including Rittinger's and Kick's laws. Submicron size is obtained at maximum frictional shear stress. Alterations in properties of wettability, heat resistance, thermal conductivity, and adhesion increase with increasing particle surface area. In the comparison of the aspect ratio of the submicron powder, the air heat conductivity and the total heat release amount increase 68 % and 2 times, respectively.

Milled carbon fiber (mCF) was prepared by a ball milling process, and X-ray diffraction (XRD) diffractograms were obtained by a 2θ continuous scanning analysis to study mCF crystallinity as a function of milling time. The raw material for the mCF was polyacrylonitrile- based carbon fiber (T700). As the milling time increased, the mean particle size of the mCF consistently decreased, reaching 1.826 μm at a milling time of 18 h. The XRD analysis showed that, as the milling time increased, the fraction of the crystalline carbon decreased, while the fraction of the amorphous carbon increased. The (002) peak became asymmetric before and after milling as the left side of the peak showed an increasingly gentle slope. For analysis, the asymmetric (002) peak was deconvoluted into two peaks, less-developed crystalline carbon (LDCC) and more-developed crystalline carbon. In both peaks, Lc decreased and d002 increased, but no significant change was observed after 6 h of milling time. In addition, the fraction of LDCC increased. As the milling continued, the mCF became more amorphous, possibly due to damage to the crystal lattices by the milling.

In this study, nano-scale copper powders were reduction treated in a hydrogen atmosphere at the relativelyhigh temperature of 350℃ in order to eliminate surface oxide layers, which are the main obstacles for fabricating anano/ultrafine grained bulk parts from the nano-scale powders. The changes in composition and microstructure beforeand after the hydrogen reduction treatment were evaluated by analyzing X-ray diffraction (XRD) line profile patternsusing the convolutional multiple whole profile (CMWP) procedure. In order to confirm the result from the XRD lineprofile analysis, transmitted electron microscope observations were performed on the specimen of the hydrogen reduc-tion treated powders fabricated using a focused ion beam process. A quasi-statically compacted specimen from the nano-scale powders was produced and Vickers micro-hardness was measured to verify the potential of the powders as thebasis for a bulk nano/ultrafine grained material. Although the bonding between particles and the growth in size of theparticles occurred, crystallites retained their nano-scale size evaluated using the XRD results. The hardness results dem-onstrate the usefulness of the powders for a nano/ultrafine grained material, once a good consolidation of powders isachieved.

To observe the formation of defects at the interface between an oxide semiconductor and SiO2, ZnO was preparedon SiO2 with various oxygen gas flow rates by RF magnetron sputtering deposition. The crystallinity of ZnO depends on thecharacteristic of the surface of the substrate. The crystallinity of ZnO on a Si wafer increased due to the activation of ionicinteractions after an annealing process, whereas that of ZnO on SiO2 changed due to the various types of defects which hadformed as a result of the deposition conditions and the annealing process. To observe the chemical shift to understand of defectdeformations at the interface between the ZnO and SiO2, the O 1s electron spectra were convoluted into three sub-peaks bya Gaussian fitting. The O 1s electron spectra consisted of three peaks as metal oxygen (at 530.5eV), O2− ions in an oxygen-deficient region (at 531.66eV) and OH bonding (at 532.5eV). In view of the crystallinity from the peak (103) in the XRDpattern, the metal oxygen increased with a decrease in the crystallinity. However, the low FWHM (full width at half maximum)at the (103) plane caused by the high crystallinity depended on the increment of the oxygen vacancies at 531.66eV due tothe generation of O2− ions in the oxygen-deficient region formed by thermal activation energy.

We study the relationships between the thermal emissivity of nuclear graphites (IG-110, PCEA, IG-430 and NBG-18) and their surface structural change by oxidation using scanning electron microscope and X-ray diffraction (XRD). The nonoxidized (0% weight loss) specimen had the surface covered with glassy materials and the 5% and 10% oxidized specimens, however, showed high roughness of the surface without glassy materials. During oxidation the binder materials were oxidized first and then graphitic filler particles were subsequently oxidized. The 002 interlayer spacings of the non-oxidized and the oxidized specimens were about 3.38~3.39a. There was a slight change in crystallite size after oxidation compared to the nonoxidized specimens. It was difficult to find a relationship between the thermal emissivity and the structural parameters obtained from the XRD analysis.

A series of activated carbons (ACs) were derived from sugarcane bagasse under two activation schemes: steam-pyrolysis at 600-800℃ and chemical activation with H3PO4 at 500℃. Some carbons were treated at 400, 600℃, or for 1-3 h, and/or in flowing air during pyrolysis of acid-impregnated mass. XRD profiles displayed two broad diffuse bands centered around 2θ=23 and 43˚, currently associated with diffraction from the 002 and 100/101 set of planes in graphite, respectively. These correspond to the interlayer spacing, Lc, and microcrystallite lateral dimensions, La, of the turbostratic (fully disordered) graphene layers. Steam pyrolysis-activated carbons exhibit only the two mentioned broad bands with enhancement in number of layers, with temperature, and small decrease in microcrystallite diameter, La. XRD patterns of H3PO4-ACs display more developed and separated peaks in the early region with maxima at 2θ=23, 26 and 29˚, possibly ascribed to fragmented microcrystallites (or partially organized structures). Diffraction within the 2θ=43˚ is still broad although depressed and diffuse, suggesting that the intragraphitic layers are less developed. Varying the conditions of chemical activation inflicts insignificant structural alterations. Circulating air during pyrolysis leads to enhancement of the basic graphitic structure with destruction and degradation in the lateral dimensions.

The structural studies of amorphous isotropic carbon prepared from pyrolysis of phenol formaldehyde resin have been carried out using X-ray diffraction. X-ray diffraction from as prepared sample at 1000℃ and a sample treated at 1900℃ revealed that both are amorphous even though there are small differences in short range order. It is found that both are graphite like carbon (GLC) with predominantly sp2 hybridization. Small angle X-ray scattering results show that as prepared sample mainly consists of thin two dimensional platelets of graphitic carbon whereas they grow in thickness to become three dimensional materials of nano dimensions.

σ-VFe 금속간화합물에 대한 기계적 합금화(MA) 효과를 중성자 및 X선 회절법으로 조사하였다. MA 분말의 구조분석은 X선 회절(Cu-Kα) 린 중성자회절(HRPD, λ=1.835Å)을 이용하여 행하였다. σ-VFe화합물의 MA시 큰 구조변화가 관찰되었으며, MA 60시간의 경우 Fe-Fe 훤자분포는 unit cell에 30개의 원자를 포함하고 있는 σ상의 tetragonal구조에서 120˚C이상에서 안정하게 존재하는 α-(V,Fe) 고용체의 bcc 구조로 상변화함을 알 수 있었다. 또한 α-VFe 화합물에 대한 중성자 및 X선 회절패턴의 비교분석을 행하였으며 그 결과 σ상이 가지는 화학적 규칙성에 기인하는 (101)과 (111) 회절 피크가 중성자 회절에서 뚜렷하게 관찰됨을 알 수 있었다.

NaNb O370 mol%와 SrTi O330 mol%의 고용체인 (Na0.7S r0.3)( Ti0.3N b0.7) O3는 완전 고용에 의한 one phase의 페로브스카이트 구조를 형성하였으며 온도변화에 대한 유전 특성 측정 결과 100K 부근에서 완만한 유전 피크가 관찰되었다. 유전 피크를 전후한 상온과 12K에서 결정 구조 해석을 Rietveld법을 이용하여 수행하였으며 결과 상온에서는 단순 페로브스카이트의 a, b 그리고 c격자를 2배로 하는 격자를 격자 상수로 갖는 사방정계의 단위포를 형성하며 공간군은 Pmmm이였고, 12K로 온도를 낮추었을때 역시 단순 페로브스카이트의 a, b 그리고 c격자를 2배로 하는 격자를 격자 상수로 갖는 사방정계 단위포를 형성하나 공간군은 Pnma로 바뀌었다. 이러한 결정 구조의 변화는 c축 방향의 (Ti, Nb)-O-(Ti, Nb) 결합 각도에는 거의 변화가 없이 팔면체 중심의 (Ti, Nb)-O간의 결합 거리가 대칭성이 낮아지는 방향으로 변화하고 이로인해 산소 팔면체가 distortion되어 생기는 것이라는 것을 알 수 있었다. 따라서 l00K 부근에서의 완만한 유전 피크는 산소 팔면체의 distortion에 의한 구조상전이 결과라는 것을 알 수 있었다.수 있었다.다.

Crystallographic properties of Ni-based alloys such as alloys 600, 617, and Hastelloy N, which are a candidate to be used as structural materials in Molten Salt Reactor (MSR), were studied in the temperature range of 25-1,000°C using high-temperature X-ray diffraction (HT-XRD) under an Ar atmosphere. We found that face-centered cubic Ni crystal structure at room temperature was started to be changed over 600°C in all Ni-based samples. However, the appearance of changing diffraction patterns over 600°C was different for all samples. In addition, we observed the increase in the lattice constant along the a-axis upon heating in all specimens, determined by Pawley refinement of HTXRD data.

본 연구는 합성 모데나이트(Na6.6Al6.6Si41.4O96·20.4H2O, Na-MOR)를 이용한 다양한 중금속의 포획 연 구를 하기 위한 기초 단계로, 고분해능 X-선 분말 회절을 이용하여 치환체의 격자상수 및 부피 변화를 이해 하기 위한 목적으로 실험을 진행하였다. 열중량 분석법(Thermogravimetric analysis, TGA)으로 측정한 결과, 1가 양이온 치환체(Cs-MOR, Na-MOR)는 단위포 당 19.4, 20.4개의 물분자가 존재하였으며, 2가 양이온 치환 체(Pb-MOR, Sr-MOR, Cd-MOR)는 단위포 당 21, 23.1, 23.2개가 존재하는 것을 확인하였다. 측정한 모든 물 질은 사방정계에 속하는 Cmcm의 공간군을 가지는 것으로 확인할 수 있었다. 치환 전 물질인 Na-MOR과 비 교했을 때, 치환체의 (110)면과 (200)면의 회절강도가 명확하게 변화하였으나, 전체적인 피크의 위치는 거의 유사하게 나타나는 것을 확인할 수 있었다. 또한 Na-MOR에서는 확인이 되지 않았던 (220)면의 피크가 Pb-, Cd-, Sr-MOR에서 뚜렷하게 관찰되었다. 이를 통해서 양이온 치환에 따른 원자들의 분포 변화가 주로 ab-평 면상에서 나타나지만, 격자상수의 변화는 미세할 것으로 짐작할 수 있었다. Whole profile fitting 방법을 사용 하여 치환된 모데나이트의 미세한 격자상수의 변화를 관찰하였다. 치환체의 격자상수 및 격자부피의 변화는 치환된 양이온의 반경 및 전하수에 따라 서로 다른 경향성을 보였다. 1가 양이온의 경우, 이온반경이 증가할 수록 a-축의 길이는 증가하지만, 반면에 b- 및 c-축의 길이는 감소하였다. 2가 양이온의 경우, 이온반경이 증 가할수록 대체적으로 a-축의 길이가 감소하고, b- 및 c-축의 길이는 증가하였다. 격자부피는 1가 또는 2가 양 이온 치환체들이 각각 독립된 경향성을 가지며, 이온반경에 따라 증가하는 것을 확인할 수 있었다.

문화재의 보존⋅관리 및 활용은 원형유지를 기본원칙으로 하므로 비파괴적인 분석법을 통한 무기질 문화재 및 그 원료물질의 광물조성을 연구하는 것은 중요한 분야이다. 본 연구는 비파괴 표면 X-선 회절분석법(ND-XRD)을 석재, 채색된 안료, 토제, 금속 등 유형별 무기질 문화재 및 시편들을 대상으로 적용하여 문화재의 비파괴 분석법 중 하나로써 활용가능성을 검토하였다. 그 결과, 기기 내에 거치가 가능하며, 구성입자의 크기나 배열 및 굴곡 등 분석대상면의 특성이 스캔에 적합한 시료일 경우 모든 유형에서 광물조성 해석에 활용 가능한 회절패턴이 획득되는 것으로 나타났다. 또한 시료의 기질부에 비하여 표면의 회절정보가 우세하게 획득되므로 수평적 또는 수직적으로 다른 물질로 구성된 대상에 적용할 경우 각 부위별 광물조성정보와 함께 이들의 선후관계 파악을 통한 제작기법 및 변질양상 등의 해석에도 활용 가능할 것으로 사료된다. 반면 시료채취 및 분말화 과정을 생략한채 문화 재시료 자체를 스캔하는 분석방법의 특성으로 인하여 특정 결정면의 정보가 강하게 중첩되는 경우가 일부 발생되었다. 이와 같은 회절패턴은 점토광물의 편향성효과와 같이 광물동정에 유리하게 활용되는 경우도 있으며, 단결정에 가까운 크기와 배열을 갖는 입자로 인하여 불규칙한 회절강도 비가 획득 되어 컴퓨터 프로그램을 통한 광물동정이 어려운 경우가 있으므로 해석에 주의가 필요하다.