Universal joint damage occurred during the operation of a combat vehicle. Damage to the internal bushing and cracks of the rubber cover occurred, and a design change was promoted based on the cause analysis and improvement measures. The failure of the bushing is due to the occurrence of expansion due to fatigue load when the rotation proceeds in the presence of the assembly clearance of the cross joint. In addition, cracks in the rubber cover are caused by the deterioration of the intermetallic rubber surface. Through this failure mechanism analysis, severe durability factors were selected and accelerated durability tests were conducted. In this paper, the final limit life of universal joints can be evaluated through accelerated endurance tests. Furthermore, the endurance life of the product before the change and the endurance life of the product after the change are compared to prove the improvement effect through design changes.

The reliability of the lifting system has to be ensured so that heavy cargo is handled safely during loading and unloading. Therefore, the accelerated life test was performed on the lifting bow shackle, which is highly affected by the main failure mode, among the components of the lifting system. Besides, an efficient inspection method was suggested for the preventive maintenance of the bow shackles. The acceleration index and acceleration coefficient of the bow shackles were calculated by using the life data of them. The guaranteed life data of the bow shackle can be used to predict the useful life in industries related to lifting work.

초가속수명시험(HALT:Highly Accelerated Life Test)은 온도변화와 진동을 통해 부품초기 고 장을 빠르게 찾아 개선함으로써 제품의 신뢰성을 향상시킨다. 이에 따라 기업들은 초가속수명시 험에 집중하게 되었고 장비의 수요와 가동률이 증가하고 있다. 그러나 초가속수명시험 장비는 대부분 해외 장비에 의존하고 있어 고장이 발생한 경우 유지보수에 대한 비용이 높고 보전까지 의 시간 또한 길다. 뿐만 아니라 장비에 대한 적절한 보전절차가 없어 비용과 시간의 손실이 발 생되는 실정이다. 본 논문에서는 국산화 개발중인 초가속수명시험 장비에 고장유형과 원인에 따른 계획보전 활 동을 진행 할 수 있도록, FMEA(Failure Modes and Effects Analysis)를 사용하여 계획보전절 차를 제시하였다.

최근 산업의 발전으로 소비자는 다양한 기능과 높은 신뢰성을 요구하게 되었다. 기 업에서는 소비자의 요구사항을 충족시키기 위해 많은 노력을 기울이고 있고, 이와 함 께 제품의 신뢰성 평가방법에 대한 관심도 높아지고 있다. 초가속수명시험(HALT : Highly Accelerated Life Test)은 초기고장을 빠르게 찾아내 개선함으로써 제품의 신 뢰성을 향상 시킨다. 이에 따라 기업들은 초가속수명시험에 집중하게 되었고 이에 따 른 장비의 수요도 증가하고 있다. 그러나 초가속수명시험 장비는 해외 장비에 의존하 고 있어 장비의 국산화 개발이 시급하다. 본 논문은 초가속수명시험 장비의 설계와 개발과정에서 신뢰성을 확보할 수 있는 FMEA(Failure Modes and Effects Analysis) 적용 방법을 연구한다. 먼저 개발 장비 의 구조와 기능을 정의하고 일반적인 설계 FMEA를 실시한다. 이를 통해 개발과정의 초가속수명시험 장비에 개선이 필요한 부품들을 확인한다. 또한 초가속수명시험 장비 의 유지보수를 위한 FMEA의 필요성을 기존 연구를 통해 제안한다.

As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, 20/20μm pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.

In the manufacturing process the most widely used x chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, ALTx control chart integrating x chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, Zp control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with ALTx control chart and Zp control chart is designed for the very small fraction nonconforming of product lifetime.

Organic light emitting diode(OLED) has been developed fast from 1963 when electric light emitting phenomenon was discovered. PMOLED(passive matrix OLED) is producted earlier than AMOLED(active matrix OLED). PMOLED is mainly mounted at sub display, but AMOLED is mounted at main display. Nowadays AMOLED is expanded to PMP(portable multimedia players), navigation and TV market. Even thought OLED's market is opening to many applications, OLED's life is worried until now. If we know about OLED's real life, we need time to test so much time over 20,000hrs. Realistically, there is difficult to test such as long time with products from the information-technology sector having a short life cycle. In this paper, we study about OLED's accelerated test to reduce life test by current. We can design OLED's accelerated life model by the result of test. The model consists of design variables like ratio of light emitting, organic material structure, condition of aging, etc. In conclusion, this model can be applied to study about organic material, machine and manufacturing process etc, and also it's possible to develop a method of manufacturing process & materials, so we need to study on the subject of this paper continuously.

In this study, we optimized Pb-free Sn/Ni plating thickness and conditions were optimized to counteract the environmental regulations, such as RoHS and ELV(End-of Life Vehicles). The B10 life verification method was also suggested to have been successful when used with the accelerated life test(ALT) for assessing Pb-free solder joint life of piezoelectric (PZT) ceramic resonator. In order to evaluate the solder joint life, a modified Norris-Landzberg equation and a Coffin-Manson equation were utilized. Test vehicles that were composed of 2520 PZT ceramic resonator on FR-4 PCB with Sn-3.0Ag-0.5Cu for ALT were manufactured as well. Thermal shock test was conducted with 1,500 cycles from (-40±2)˚C to (120±2)˚C, and 30 minutes dwell time at each temperature, respectively. It was discovered that the thermal shock test is a very useful method in introducing the CTE mismatch caused by thermo-mechanical stress at the solder joints. The resonance frequency of test components was measured and observed the microsection views were also observed to confirm the crack generation of the solder joints.

There has been much research on the reliability and durability of the product life cycle using accelerated life test(ALT), accelerated stress test(AST) and accelerated stress audit(ASA) in the industry. Most of these systems use vibration induced by acceleration and deceleration. The device used for these kinds of research should have wide-band exciting frequency ranges to find the weak mode of the product. In this paper, platform of ALT based on the Stewart platform is controlled by using pneumatic actuators. Pneumatic actuators use motion and impact in this paper to cause wide-band exciting frequency. The change in frequency and pressure in the six cylinders is used to control the level of exciting vibration. Many control strategies are tested to improve the performance and one of the best control algorithms is suggested.

Display's life time is defined as the time of 50% luminance drop. It was used luminance and temperature as accelerated factor to accelerated lifetime at test. When it's working jule-heat is generated and device's temperature is growing as any temperature because OLED is self-luminance display device. So we decided temperature condition is 25, 70℃, and luminance condition is 60~300cd/m2 in test. It's assumed accelerated lifetime model by result of the test.

To application Arrhenius model for OLED's lifetime, it's needed in high temperature test. Because OLED's character is changed in high temperature, it's important to find limit temperature. We found out 40℃ is proper temperature by result of tests. But that is not enough acceleration to apply in practical affairs. We find new stress to get a bigger accelerated constant.

This paper is to present linkage parameter to integrate statistical models and physical models for accelerated life test. Statistical models represent the relationship of probability distribution and life. Physical models show the relationship of life and stress. Moreover, this study proposes the four steps for construction of integrated models for accelerated life test using linkage parameter. Finally, this paper develops new integrated models such as extreme value distribution-general Eyring, linearly increasing failure rate function-general Eyring, etc., and estimates various reliability measures.

Recently, there are many researches that are performed for increasing reliability about product life cycle using ALT(Accelerated Life Test), AST(Accelerated Stress Test) and ASA(Accelerated Stress Audit) in the industry. The test of this research needs a device that has wide-band frequency vibration. But most test devices such as HALT only show the good response of high frequency area. In this research, the platform of ALT was developed based on Stewart Platform using pneumatic Actuators. Pneumatic Actuators represent response of wide-band frequency by motion and mpact. Cylinders of Stewart Platform is operated based on frequency and pressure. This research shows system characteristic of Platform to develop the control algorithm of accelerated life test platform in future research.

Air pollution problem has been one of the most urgent global environmental problems since UN Framework Convention on Climate Change accepted in Rio Conference, 1992. International environmental regulations of global community to reduce the green house gases have Influenced the domestic environmental policies. Recently, various policy have been made to cope with foreign environment restrction and active supports for development of related technology have been carried out in our government confrontation strategy still leaves much to be desired. In this paper, government confrontation program to climate agreement, counter strategies in motor and also electrics, electronics industries are investigated and discussed.

This paper concerned with design of constant stress accelerated lift test(ALT). Becase a major factor to affect a life of automotive V-ribbed belts is a temperature, we selected a temperature as a accelerated fator to perform a test. Acclelerated life test plans were developed with the assumption of weibull lifetime distribution. The genreal value of beta parameter was accepted in this life test (β=1.1). The sample number was calculated by alpha parameter which was induced by beta.

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, S, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, θ is a random variable of environments and a function of probabilistic stress. In detail, it is assumed that the hazard rate is linear function of the stress, the general stress distribution is a gamma distribution and the life distribution for the given hazard rate, θis an exponential distribution. Maximum likelihood estimators of model parameters are obtained, and the mean life in use stress condition is estimated. A hypothetical example is given to show its applicability.

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, Sj, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, ,thetaj, is the random variable of environments and the function of probabilistic stress. Also it is assumed that the general stress distribution is uniform, the life distribution for the given hazard rate, θ, is exponential and inverse power law model holds. In this paper, we obtained maximum likelihood estimators of model parameters and the mean life in use stress condition.