The high-level nuclear waste (HLW) repository is a 500-1,000 m deep geological disposal system with a very long life expectancy for disposing of high-level waste, which is known to have a half-life of several thousand years. This repository is subject to harsh environmental conditions, such as high temperature and radiation from high-level waste, that can cause deterioration and crack. When radiation escapes through cracks, it can injure persons on the ground. Therefore, it is essential to install a sensor that can detect problems such as cracks. But, since the high-level nuclear waste (HLW) repository is sealed with bentonite and backfill, the sensor cannot be removed or replaced once it has been installed. Therefore, it is necessary to develop a highly durable monitoring sensor that can withstand harsh environmental conditions. Before attempting to improve durability, it is first required to assess durability quantitatively. And an accelerated life test is a widely used method for assessing durability. However, it is important to obtain the same failure mode when conducting a reliability test, such as an accelerated life test. If the accelerated life test is conducted using different failure modes, the dependability of the results is inevitably diminished. Therefore, in this study, a representative failure mode for the piezoelectric sensor used in the accelerated life test was derived through experiments and literature research.
The high-level waste disposal system is an underground structure exposed to complex environmental conditions such as high temperature, radiation, and groundwater. The high-level waste disposal causes structural cracks and deterioration over time. However, since the high-level waste disposal system is a structure that should be operated for a very long time, developing a high-durability monitoring sensor to detect cracks and deterioration is essential. The durability of the sensor can be evaluated by predicting the expected life through the accelerated life test, one of the reliability qualification tests. The most important factor in the accelerated life test design is setting the harsh stress level. This study figured out the harsh stress level of the piezoelectric sensor, which is commonly used for underground structure monitoring. It is possible to determine the appropriate stress level for the accelerated life test by investigating the harsh stress level for the temperature factor. It will contribute to more accurate life expectancy prediction.
The high-level nuclear waste disposal system is a structure with a very long life expectancy, and deterioration and cracking of the structure may occur over time. In addition, the high-level nuclear waste disposal system is in complex extreme conditions such as high temperature, groundwater, and radiation. Therefore, we need to develop a highly durable monitoring sensor that can detect the deterioration and crack of structures in extreme conditions. Since the durability of a sensor is closely related to the sensor lifetime, it is essential to predict the sensor lifetime accurately. The sensor lifetime can be predicted through the reliability qualification test. Among them, the accelerated life test conducted under harsh conditions is widely used as a method to shorten the test period. The major factor in carrying out the accelerated life test is to set the appropriate harsh conditions. Therefore, this study experimentally derived the operating limit of the monitoring sensor. It is essential to set the proper harsh conditions when performing the accelerated life test. Through this study, it is judged that it will be helpful in determining the appropriate stress level when performing the accelerated life test for accurate lifetime prediction.
In this study, an accelerated weathering test was performed to examine the variation of thermal insulation performance according to the service life. A widely used class 1 thermal screen (matt georgette + polyethylene (PE) foam + chemical cotton + felt + matt georgette) was selected as the target thermal screen. The ultraviolet irradiation that reached the target thermal screen specimen (60 x 60cm) was 5mW/cm2. Thus, the ultraviolet irradiance was set to 5mW/cm2, and the exposure periods of accelerated weathering conditions on the specimens were set to 0, 282, 847, and 1412h. The radiation exposure periods of the weathering conditions for 0, 282, 847, and 1412h indicate the amount of ultraviolet accumulation for 0, 1, 3, and 5years, respectively. In the accelerated weathering test, the target specimens that completed each exposure phase were subjected to the hotbox test to analyze their thermal insulation performances. Consequently, the thermal insulation performance of the multi-layer thermal screen was estimated to degrade rapidly after approximately two years. In the accelerated weathering condition, a quadratic function model was used to calculate the expected service life, since it adequately described the variation in thermal insulation of the thermal screen according to time. The results showed that when the thermal insulation performance degraded by 5, 10, 20, and 30%, the expected service lives were 2.5, 3.3, 4.5, and 5.5years, respectively.
Universal joint damage occurred during the operation of a combat vehicle. Damage to the internal bushing and cracks of the rubber cover occurred, and a design change was promoted based on the cause analysis and improvement measures. The failure of the bushing is due to the occurrence of expansion due to fatigue load when the rotation proceeds in the presence of the assembly clearance of the cross joint. In addition, cracks in the rubber cover are caused by the deterioration of the intermetallic rubber surface. Through this failure mechanism analysis, severe durability factors were selected and accelerated durability tests were conducted. In this paper, the final limit life of universal joints can be evaluated through accelerated endurance tests. Furthermore, the endurance life of the product before the change and the endurance life of the product after the change are compared to prove the improvement effect through design changes.
The reliability of the lifting system has to be ensured so that heavy cargo is handled safely during loading and unloading. Therefore, the accelerated life test was performed on the lifting bow shackle, which is highly affected by the main failure mode, among the components of the lifting system. Besides, an efficient inspection method was suggested for the preventive maintenance of the bow shackles. The acceleration index and acceleration coefficient of the bow shackles were calculated by using the life data of them. The guaranteed life data of the bow shackle can be used to predict the useful life in industries related to lifting work.
The purpose of this study was to assess cross-generational effects of bisphenol A exposure in benthic copepods, Tigriopus west. Nauplii (<24 hours old) were exposed to graded concentrations of bisphenol A, and toxicity end-points such as survival, development, sex ratio, and fecundity were measured. F1 generations were grown under innoxious conditions, and similarly assessed. Significant differences were observed in development of nauplii and copepodites, between exposed and non-exposed copepods; however, there were no differences in survival of nauplii or copepodites, sex ratio, or brooding rate in parental generation. In contrast, in the F1 generation, there were significant differences between the control group and exposed group in survival and development of nauplii. Length, width, and biomass of parental and F1 generations were reduced in the exposed group compared to the control group. In addition, some deformities, such as swelling of the prosome, abnormally shaped egg sac, and dwarfism were observed after exposure to bisphenol A. So, our study demonstrates that a cross-generation toxicity test and monitoring of morphological deformities in harpacticoid copepods, can be useful for development of potential bioindicators for environmental monitoring, and assessment of chemical impact.
제품 개발기간의 단축속도가 빨라지는 현 시점과 제품의 부품 시험을 통한 개발 과 정은 현실적인 한계에 부딪히고 있다. 이러한 문제점을 해결하기 위해 지금 까지는 가 속수명시험(Accelerated Life Test)법을 개발·적용해 왔다. 그러나 제품의 사용조건이 가혹해 짐으로써 온도를 이용한 가속시험을 적용하기에는 한계가 있다. HALT는 급격한 온도변화와 6축 진동을 시료에 전달할 수 있는 장비로써 위의 조 건을 충족시킬 수 있다.[5] 그러므로 본 연구에서는 부품과 재료의 신뢰도 정보를 신속 하게 얻을 수 있는 HALT의 국내외 연구 동향과 적용 현황을 비교 분석 뿐만 아니라 HALT와 HASS의 효과적인 활용방안을 모색하고자 한다.[2]
As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, 20/20μm pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.
Light emitting diode(LED) plays important role in illumination applications such as general lighting, automotive, and outdoor lights due to their high reliability and energy saving elements. The long lifetime is one of the main advantages of LED and thus, the Accelerated Life T(ALT) is used to help achieving the target life time. This paper presents the investigation of ALT models and failures for LED in recent literatures. LED reliability improvement technologies will be discussed finally.
Organic light emitting diode(OLED) has been developed fast from 1963 when electric light emitting phenomenon was discovered. PMOLED(passive matrix OLED) is producted earlier than AMOLED(active matrix OLED). PMOLED is mainly mounted at sub display, but AMOLED is mounted at main display. Nowadays AMOLED is expanded to PMP(portable multimedia players), navigation and TV market. Even thought OLED's market is opening to many applications, OLED's life is worried until now. If we know about OLED's real life, we need time to test so much time over 20,000hrs. Realistically, there is difficult to test such as long time with products from the information-technology sector having a short life cycle. In this paper, we study about OLED's accelerated test to reduce life test by current. We can design OLED's accelerated life model by the result of test. The model consists of design variables like ratio of light emitting, organic material structure, condition of aging, etc. In conclusion, this model can be applied to study about organic material, machine and manufacturing process etc, and also it's possible to develop a method of manufacturing process & materials, so we need to study on the subject of this paper continuously.
There has been much research on the reliability and durability of the product life cycle using accelerated life test(ALT), accelerated stress test(AST) and accelerated stress audit(ASA) in the industry. Most of these systems use vibration induced by acceleration and deceleration. The device used for these kinds of research should have wide-band exciting frequency ranges to find the weak mode of the product. In this paper, platform of ALT based on the Stewart platform is controlled by using pneumatic actuators. Pneumatic actuators use motion and impact in this paper to cause wide-band exciting frequency. The change in frequency and pressure in the six cylinders is used to control the level of exciting vibration. Many control strategies are tested to improve the performance and one of the best control algorithms is suggested.
신뢰성 평가 시험은 종종 성능 평가에 장기간의 시간이 요구되며, 전체 생산비용까지 증가시키는 문제점을 안고 있다. 스트레스를 이용한 가속수명시험은 제품의 신뢰성 고장과 밀접한 관련이 있는 고장 메커니즘의 촉진을 통해 고장에 이르는 기간을 단축함으로써 신뢰성 평가의 효율성을 도모할 수 있다. 본 연구에서는 이러한 스트레스 가속 시험에 빈도가속(Usage-Rate Acceleration) 또는 판정가속(Tightening Critical-Values) 등을
This paper presents the log likelihood function for integrated models for ALT such as exponential-general Eyring, Weibull-temperature and specific heat, lognormal-temperature and specific heat. Additionally this paper estimates the system reliability and mean time to failure(MTTF) for series, parallel, k of n, and standby system using ALT linkage parameter. Lastly this study designs three variable reliability acceptance sampling(RAS) plans such as type I, II censored test, sequential test by the use of integrated models for ALT.
The turnip aphid is a worldwide pest, damaging mainly to crucifers. In order to understand the life parameters of Lipaphis erysimi for the eventual goal of control, the developmental periods, survival rates, lifespan, and fecundity of the species were investigated under five temperature regimes (15℃ - 35℃). Furthermore, the efficacy of several environment-friendly agricultural materials (EFAMs) that are on the market was subjected to test in order to obtain further accurate information. The developmental period of the turnip aphid nymph was longest at 15ºC as 16.9 days, shortened as temperature goes up to 25ºC (5.4 days), and then somewhat increased at 30ºC (5.9 days), suggesting that the most efficient temperature for nymphal development could be around 25ºC. Mortality of the nymphal turnip aphid was obvious at 35ºC, whereas it was minimal at other temperature schemes. The longevity of adults shortened as temperature goes up to 30ºC. In particular, the maximum lifespan for adults continued for 55 days at 15ºC, but shortened to 21 days at 30ºC. The total fecundity per day was 35.7 at 15ºC, 81 at 20ºC, 64.2 at 25ºC, and 6.6 individuals at 30ºC, showing the highest fecundity at 20ºC. After the turnip aphids were successfully stabilized in indoor environment the insecticidal activity was tested and mortality was determined 12, 24, 36, and 48 hrs after EFAMs are treated. Several on-the-market EFAMs showed more than 90% of insecticidal activity within 24 hrs or 48 hrs, but a few showed less than 90% activity, signifying importance of selection of proper EFAMs.
This paper is to present linkage parameter to integrate statistical models and physical models for accelerated life test. Statistical models represent the relationship of probability distribution and life. Physical models show the relationship of life and stress. Moreover, this study proposes the four steps for construction of integrated models for accelerated life test using linkage parameter. Finally, this paper develops new integrated models such as extreme value distribution-general Eyring, linearly increasing failure rate function-general Eyring, etc., and estimates various reliability measures.
Recently, there are many researches that are performed for increasing reliability about product life cycle using ALT(Accelerated Life Test), AST(Accelerated Stress Test) and ASA(Accelerated Stress Audit) in the industry. The test of this research needs a device that has wide-band frequency vibration. But most test devices such as HALT only show the good response of high frequency area. In this research, the platform of ALT was developed based on Stewart Platform using pneumatic Actuators. Pneumatic Actuators represent response of wide-band frequency by motion and mpact. Cylinders of Stewart Platform is operated based on frequency and pressure. This research shows system characteristic of Platform to develop the control algorithm of accelerated life test platform in future research.