목적 : 본 연구에서는 회절격자가 광원의 깊이에 따라 회절영상을 주기적으로 생성하는 광학적 특성을 이용하여 중간 범위의 깊이를 측정할 수 있는 시스템을 연구하였다. 방법 : 첫 번째로 회절격자 영상시스템을 기하광학적으로 분석합니다. 두 번째로 회절격자의 주기적인 결상특성 을 파동광학적으로 분석하였다. 세 번째로 주기적인 함수사이의 콘볼루션 특성을 이용하여 깊이에 대응하는 공간주 기를 도출하였다. 네 번째로 1 m에서 4 m까지 1 m마다 타켓을 설치한후 회절격자, 카메라, 레이저로 구성된 회절 격자 영상시스템을 이용하여 회절영상을 획득하는 광학실험을 수행하였다. 다섯 번째로 첫 번째 과정에서 세 번째 과정까지 수행한 이론적 분석을 네 번째 과정에서 획득된 회절영상에 적용하여 깊이측정을 수행하였다. 마지막으로 결과 분석을 통해 시스템의 깊이해상도를 도출하였다. 결과 : 깊이 측정 실험을 수행하였고 제안된 방법의 타당성을 검증하였다. 회절영상배열의 공간주기는 타겟물체 와 회절격자사이의 거리가 멀어질수록 증가한다, 그러나 그 증가하는 비율은 물체거리에 반비례하였다. 결론 : 회절격자의 특성을 응용한 깊이 측정 시스템을 제안하였으며 이론분석과 광학실험을 통해 타당성을 검증 하였다.

Crystallographic properties of Ni-based alloys such as alloys 600, 617, and Hastelloy N, which are a candidate to be used as structural materials in Molten Salt Reactor (MSR), were studied in the temperature range of 25-1,000°C using high-temperature X-ray diffraction (HT-XRD) under an Ar atmosphere. We found that face-centered cubic Ni crystal structure at room temperature was started to be changed over 600°C in all Ni-based samples. However, the appearance of changing diffraction patterns over 600°C was different for all samples. In addition, we observed the increase in the lattice constant along the a-axis upon heating in all specimens, determined by Pawley refinement of HTXRD data.

The most comprehensive and particularly reliable method for non-destructively measuring the residual stress of the surface layer of metals is the sin method. When X-rays were used the relationship of sin measured on the surface layer of the processing metal did not show linearity when the sin method was used. In this case, since the effective penetration depth changes according to the changing direction of the incident X-ray,  becomes a sin function. Since  cannot be used as a constant, the relationship in sin cannot be linear. Therefore, in this paper, the orthogonal function method according to Warren’s diffraction theory and the basic profile of normal distribution were synthesized, and the X-ray diffraction profile was calculated and reviewed when there was a linear strain (stress) gradient on the surface. When there is a strain gradient, the X-ray diffraction profile becomes asymmetric, and as a result, the peak position, the position of half-maximum, and the centroid position show different values. The difference between the peak position and the centroid position appeared more clearly as the strain (stress) gradient became larger, and the basic profile width was smaller. The weighted average strain enables stress analysis when there is a strain (stress) gradient, based on the strain value corresponding to the centroid position of the diffracted X-rays. At the 1/5 max height of X-ray diffraction, the position where the diffracted X-ray is divided into two by drawing a straight line parallel to the background, corresponds approximately to the centroid position.

Lately, Raman spectroscopy has become powerful tool for quality assessment of graphene analogues with identification of intensity ratio of Raman active D-band and G-band ( ID/IG ratio) as a vital parameter for quantification of defects. However, during chemical reduction of graphitic oxide (GrO) to reduced GrO (RGrO), the increased ID/ IG ratio is often wrongly recognized as defect augmentation, with “formation of more numerous yet smaller size sp2 domains” as its explanation. Herein, by giving due attention to normalized peak height, full-width half-maxima and integrated peak area of Raman D- and G-bands, and compliment the findings by XRD data, we have shown that in-plane size of sp2 domains actually increases upon chemical reduction. Particularly, contrary to increased ID/ IG ratio, the calculated decrease in integrated peak area ratio ( AD/AG ratio) in conjunction with narrowing of D-band and broadening of G-band, evinced the decrease in in-plane defects. Finally, as duly supported by reduction induced broadening of interlayer-spacing characteristic XRD peak and narrowing of ~ 43° centered XRD hump, we have also shown that the sp2 domains actually expands in size and the observed increase in ID/ IG ratio is indeed due to increase in across-plane defects, formed via along-the-layer slicing of graphitic domains.

As a case study on aspect ratio behavior, Kaolin, zeolite, TiO2, pozzolan and diatomaceous earth minerals are investigated using wet milling with 0.3 pai media. The grinding process using small media of 0.3 pai is suitable for current work processing applications. Primary particles with average particle size distribution D50, ~6 μm are shifted to submicron size, D50 ~0.6 μm, after grinding. Grinding of particles is characterized by various size parameters such as sphericity as geometric shape, equivalent diameter, and average particle size distribution. Herein, we systematically provide an overview of factors affecting the primary particle size reduction. Energy consumption for grinding is determined using classical grinding laws, including Rittinger's and Kick's laws. Submicron size is obtained at maximum frictional shear stress. Alterations in properties of wettability, heat resistance, thermal conductivity, and adhesion increase with increasing particle surface area. In the comparison of the aspect ratio of the submicron powder, the air heat conductivity and the total heat release amount increase 68 % and 2 times, respectively.

Fatigue crack growth retardation of 304 L stainless steel is studied using a neutron diffraction method. Three orthogonal strain components(crack growth, crack opening, and through-thickness direction) are measured in the vicinity of the crack tip along the crack propagation direction. The residual strain profiles (1) at the mid-thickness and (2) at the 1.5 mm away from the mid-thickness of the compact tension(CT) specimen are compared. Residual lattice strains at the 1.5 mm location are slightly higher than at the mid-thickness. The CT specimen is deformed in situ under applied loads, thereby providing evolution of the internal stress fields around the crack tip. A tensile overload results in an increased magnitude of the compressive residual stress field. In the crack growth retardation, it is found that the stresses are dispersed in the crack-wake region, where the highest compressive residual stresses are measured. Our neutron diffraction mapping results reveal that the dominant mechanism is by interrupting the transfer of stress concentration at the crack tip.

Milled carbon fiber (mCF) was prepared by a ball milling process, and X-ray diffraction (XRD) diffractograms were obtained by a 2θ continuous scanning analysis to study mCF crystallinity as a function of milling time. The raw material for the mCF was polyacrylonitrile- based carbon fiber (T700). As the milling time increased, the mean particle size of the mCF consistently decreased, reaching 1.826 μm at a milling time of 18 h. The XRD analysis showed that, as the milling time increased, the fraction of the crystalline carbon decreased, while the fraction of the amorphous carbon increased. The (002) peak became asymmetric before and after milling as the left side of the peak showed an increasingly gentle slope. For analysis, the asymmetric (002) peak was deconvoluted into two peaks, less-developed crystalline carbon (LDCC) and more-developed crystalline carbon. In both peaks, Lc decreased and d002 increased, but no significant change was observed after 6 h of milling time. In addition, the fraction of LDCC increased. As the milling continued, the mCF became more amorphous, possibly due to damage to the crystal lattices by the milling.

Fatigue crack growth experiments were carried out on a 304 L stainless steel compact-tension(CT) specimen under load control mode. Neutron diffraction was employed to quantitatively measure the residual strains/stresses and the evolution of stress fields in the vicinity of a propagating fatigue-crack tip. Three principal stress components (i.e. crack growth, crack opening, and through-thickness direction stresses) were examined in-situ under loading as a function of distance from the crack tip along the crack-propagation path. The stress/strain fields, measured both at the mid-thickness and near the surface of the CT specimen, were compared. The results show that much higher compressive residual stress fields developed in front of the crack tip near the surface than developed at the mid-thickness area. The change of the stresses ahead of the crack tip under loading is more significant at the mid-thickness area than it is near the surface.

In this study, nano-scale copper powders were reduction treated in a hydrogen atmosphere at the relativelyhigh temperature of 350℃ in order to eliminate surface oxide layers, which are the main obstacles for fabricating anano/ultrafine grained bulk parts from the nano-scale powders. The changes in composition and microstructure beforeand after the hydrogen reduction treatment were evaluated by analyzing X-ray diffraction (XRD) line profile patternsusing the convolutional multiple whole profile (CMWP) procedure. In order to confirm the result from the XRD lineprofile analysis, transmitted electron microscope observations were performed on the specimen of the hydrogen reduc-tion treated powders fabricated using a focused ion beam process. A quasi-statically compacted specimen from the nano-scale powders was produced and Vickers micro-hardness was measured to verify the potential of the powders as thebasis for a bulk nano/ultrafine grained material. Although the bonding between particles and the growth in size of theparticles occurred, crystallites retained their nano-scale size evaluated using the XRD results. The hardness results dem-onstrate the usefulness of the powders for a nano/ultrafine grained material, once a good consolidation of powders isachieved.

To observe the formation of defects at the interface between an oxide semiconductor and SiO2, ZnO was preparedon SiO2 with various oxygen gas flow rates by RF magnetron sputtering deposition. The crystallinity of ZnO depends on thecharacteristic of the surface of the substrate. The crystallinity of ZnO on a Si wafer increased due to the activation of ionicinteractions after an annealing process, whereas that of ZnO on SiO2 changed due to the various types of defects which hadformed as a result of the deposition conditions and the annealing process. To observe the chemical shift to understand of defectdeformations at the interface between the ZnO and SiO2, the O 1s electron spectra were convoluted into three sub-peaks bya Gaussian fitting. The O 1s electron spectra consisted of three peaks as metal oxygen (at 530.5eV), O2− ions in an oxygen-deficient region (at 531.66eV) and OH bonding (at 532.5eV). In view of the crystallinity from the peak (103) in the XRDpattern, the metal oxygen increased with a decrease in the crystallinity. However, the low FWHM (full width at half maximum)at the (103) plane caused by the high crystallinity depended on the increment of the oxygen vacancies at 531.66eV due tothe generation of O2− ions in the oxygen-deficient region formed by thermal activation energy.

This paper is to investigate propagation path characteristics of GPS potential jamming signal. To do this, the spherical ground diffraction model is applied to the potential jamming scenario referred to the GPS jamming events occurred in recent years. The fundamental theory on the propagation path loss is discussed and a specific model is applied to several vehicles types which have own heights of antennas in order to compare their propagation path loss values at same 2-D location. The transmitting powers are appropriately given as the ordinary GPS jamming events. And then the received powers in dBW are obtained with given transmitting powers and the estimated total loss. The result of received jamming power at various locations due to the given scenario was distinct. For example, propagation loss values were estimated as -147 ~ -142dBW and -167 ~ -162dBW in 106W and 104W, respectively. This computation result of the loss can be seriously considered with the tolerable jammer power against L1- C/A GPS receiver under any real jamming situations.

CD와 DVD에서 발생하는 빛의 회절을 정량적으로 분석하기 위해 본 연구에서는 회절격자와 CD, DVD에의한 회절무늬를 비교하였다. SEM 측정을 통해 격자간격을 비교하였고, 입사각과 회절각을 측정하여 이론적인 격자간격을 계산하였다. 또한, 다양한 파장을 갖는 Ar-ion 레이저에 의해 발생된 1차 회절광의회절각과 세기를 측정하여 그 결과를 정량적으로 비교하였다. 비교결과, DVD는 회절격자와 CD보다 더좁은 격자간격을 가졌으며, 그 회절광은 다른 회절광에 비해 강했다. 또한, 회절격자와 CD에 비해 더 좁은 격자간격과 더 강한 회절광을 가진 DVD에서 보다 우수한 회절성능이 관찰되었다.

We study the relationships between the thermal emissivity of nuclear graphites (IG-110, PCEA, IG-430 and NBG-18) and their surface structural change by oxidation using scanning electron microscope and X-ray diffraction (XRD). The nonoxidized (0% weight loss) specimen had the surface covered with glassy materials and the 5% and 10% oxidized specimens, however, showed high roughness of the surface without glassy materials. During oxidation the binder materials were oxidized first and then graphitic filler particles were subsequently oxidized. The 002 interlayer spacings of the non-oxidized and the oxidized specimens were about 3.38~3.39a. There was a slight change in crystallite size after oxidation compared to the nonoxidized specimens. It was difficult to find a relationship between the thermal emissivity and the structural parameters obtained from the XRD analysis.

Ni-W(1-5 at.%) alloy rods were made by powder metallurgy process including powder mixing, compacting and subsequent sintering. Ni and W powder of appropriate compositions were mixed by a ball milling and isostatically pressed in a rubber mold into a rod. The compacted rods were sintered at at a reduced atmosphere for densification. The lattice parameters of Ni-W alloys were estimated by a high resolution neutron powder diffractometer. All sintered rods were found to have a face centered cubic structure without any impurity phase, but the diffraction peak locations were linearly shifted with increasing W content. The lattice parameter of a pure Ni rod was which is consistent with the value reported in JCPDS data. The lattice parameter of N-W alloy rods increased by for 1 atomic % of W, which indicates the formation of a Ni-W solid solution due to the substitution of nickel atoms by tungsten atoms of larger size.